Amdocs Development Limited

Yossi Bitton

Itsik David

Yasmin Bel Klein

Dror Avrilingi

Ighal Szyk

Limor Gueta

As described herein, a system, method, and computer program are provided for defect resolution. Information associated with a defect detected in a computer system is received. The information is processed, using a first machine learning model, to predict a source of the defect. The information and the source of the defect are processed, using a second machine learning model, to predict one or more parameters for handling the defect. One or more actions are caused to be performed to resolve the defect, based on the predicted one or more parameters for handling the defect.

System, method, and computer program for defect resolution

As described herein, a system, method, and computer program are provided for orchestrating automatic software testing. In use, an interface to a plurality of different testing tools is provided, where each testing tool of the plurality of different testing tools usable for performing one or more testing-related tasks. Additionally, information describing a software project is identified. Further, use of the plurality of different testing tools is orchestrated to provide automated testing for the software project.

Growing community of inventors

Petach Tiqwa, Israel

Yossi Bitton