Advantest Test Solutions, Inc.

Yoshiyuki Aoki

Samer Kabbani

Karthik Ranganathan

Ira Leventhal

Gilberto Oseguera

Keith Schaub

Koji Miyauchi

Amit Kucheriya

Kotaro Hasegawa

A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

Shielded socket and carrier for high-volume test of semiconductor devices

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San Jose, CA, United States of America

Yoshiyuki Aoki