Rigaku Corporation

Cosmo Oil Co., Ltd.

Nec Toshiba Space Systems, Ltd.

Sbi Pharmaceuticals Co., Ltd.

Yoshiyasu Ito

Kazuhiko Omote

Kiyoshi Ogata

Hiroshi Motono

Sei Yoshihara

Katsutaka Horada

Shigematsu Asano

Hideaki Takahashi

Naoki Matsushima

Shiro Umegaki

Akifusa Higuchi

Sensui Yasuda

Shoko Suyama

Ryotaro Yamaguchi

Takao Kinefuchi

Muneo Yoshida

Katsuhiko Tsuno

Licai Jiang

Boris Verman

Asao Nakano

Naoki Kawahara

Akito Sasaki

Makoto Kambe

Tomoyasu Ueda

Tsuneji Kameda

A transmission type small-angle scattering device of the present invention includes a goniometerincluding a rotation arm. The rotation armis freely turnable around a θ-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation armbeing defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unitis installed on a lower-side end portion of the rotation arm, and a two-dimensional X-ray detectoris installed on an upper-side end portion of the rotation armto form a vertical arrangement structure.

Transmissive small-angle scattering device

A transmission type small-angle scattering device of the present invention includes a goniometerincluding a rotation arm. The rotation armis freely turnable around a &#x3b8;-axis extending in a horizontal direction from an origin with a vertical arrangement state of the rotation arm being defined as the origin, and has a vertical arrangement structure in which an X-ray irradiation unitis installed on a lower-side end portion of the rotation arm, and a two-dimensional X-ray detectoris installed on an upper-side end portion of the rotation armto form a vertical arrangement structure.

Provided is a fine structure determination method capable of easily determining tilt angles of columnar scattering bodies that are long in a thickness direction, and provided are an analysis apparatus and an analysis program thereof. There is provided an analysis method for a fine structure of a plate-shaped sample formed to have columnar scattering bodies that are long in a thickness direction and periodically arranged, comprising the steps of preparing scattering intensity data from the plate-shaped sample, that is generated via transmission of X-rays; and determining tilt angles of the scattering bodies in the plate-shaped sample with respect to a reference rotation position at which a surface of the plate-shaped sample is perpendicular to an incident direction of the X-rays, based on the prepared scattering intensity data.

Analysis method for fine structure, and apparatus and program thereof

Provided is an analysis method for a fine structure, that is capable of determining shapes of scattering bodies that are long in a thickness direction of a plate-shaped sample; and provided are an apparatus and a program thereof. There is provided an analysis method for a fine structure of a plate-shaped sample formed to have scattering bodies that are long in a thickness direction and periodically arranged, comprising the steps of preparing data of a scattering intensity from the plate-shaped sample measured via transmission of X-rays at a plurality of &#x3c9; rotation angles; calculating a scattering intensity of the X-rays scattered by the plate-shaped sample under a specific condition; fitting the calculated scattering intensity to the prepared scattering intensity; and determining shapes of the scattering bodies for the plate-shaped sample, based on a result of the fitting.

Analysis method for fine structure, apparatus, and program

An X-ray inspection device of the present invention includes a sample placement unitfor placing a sample as an inspection target therein, a sample placement unit positioning mechanismfor moving the sample placement unit, a goniometerincluding first and second rotation membersthat rotate independently of each other, an X-ray irradiation unitinstalled on the first rotation member, and a two-dimensional X-ray detectorinstalled on the second rotation member. The sample placement unit positioning mechanismincludes a &#x3c7; rotation mechanismfor rotating the sample placement unitand a &#x3d5;-axis about a &#x3c7;-axis that is orthogonal to a &#x3b8;s-axis and a &#x3b8;d-axis at a measurement point P and extends horizontally.

X-ray inspection device

A hybrid inspection system of the present invention is an inspection system including a first inspection device () for inspecting a sample () based on X-ray measurement data obtained by irradiating the sample () with X-rays, and a second inspection device () for inspecting the sample () by a measuring method using no X-rays. The X-ray measurement data obtained by the first inspection device or an analysis result of the X-ray measurement data is output to the second inspection device (). In the second inspection device (), the structure of the sample () is analyzed by using the X-ray measurement data input from the first inspection device () or the analysis result of the X-ray measurement data.

Hybrid inspection system

In an X-ray inspection device according to the present invention, an X-ray irradiation unitincludes a first X-ray optical elementfor focusing characteristic X-rays in a vertical direction, and a second X-ray optical elementfor focusing the characteristic X-rays in a horizontal direction. The first X-ray optical elementis constituted by a crystal material having high crystallinity. The second X-ray optical element includes a multilayer mirror.

X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve

An X-ray thin film inspection device according to the present invention has an X-ray irradiation unitmounted in a first rotation arm, an X-ray detectormounted in a second rotation arm, a fluorescence X-ray detectorfor detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unitfor measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit

X-ray thin film inspection device

An X-ray thin film inspection device of the present invention includes an X-ray irradiation unitinstalled on a first rotation arm, an X-ray detectorinstalled on a second rotation arm, and a fluorescence X-ray detectorfor detecting fluorescence X-rays generated from an inspection target upon irradiation of X-rays. The X-ray irradiation unitincludes an X-ray optical elementcomprising a confocal mirror for receiving X-rays radiated from an X-ray tube, reflects plural focused X-ray beams monochromatized at a specific wavelength and focuses the plural focused X-ray beams to a preset focal point, and a slit mechanismfor passing therethrough any number of focused X-ray beams out of the plural focused X-ray beams reflected from the X-ray optical element

The present invention provides an external preparation for skin which contains 5-aminolevulinic acids as active components and which is excellent in skin-beautifying effects such as prevention/amelioration of skin roughness, dry skin, wrinkles, sagging and flecks of skin, and improvement of turnover of corneum; and in an ameliorating effect on skin diseases such as atopic dermatitis. An external preparation for skin which contains one or more compounds selected from the group consisting of 5-aminolevulinic acid, its salt and a derivative of them; and an iron compound; as active components, is used.

External preparation for skin

There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure.

Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device

The object of the present invention is to provide a hair restorer which exhibits a stimulatory effect on hair restoration against hair loss, hair thinning, split ends, hair graying, etc., with higher stability and safety than those of known hair restorers containing 5-aminolevulinic acids as active components. By using 5-aminolevulinic acid or its salt or its derivative, and a composition containing iron sodium diethylenetriaminepentaacetate or iron ammonium diethylenetriaminepentaacetate as active components, a hair restorer and a method for restoring hair which are excellent in hair growth promotion, and stability and safety, are provided.

Hair restorer

An optical device has a reflecting mirror using a particle-dispersed silicon material including silicon carbide and silicon. The reflecting mirror includes a plurality of segments joined to each other by reaction sintering. Producing the segments is easy in comparison with that of a reflecting mirror of one piece. Accordingly, it is possible to reduce probability of breakage of the segments and to shorten process time of production of a reflecting mirror.

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Tokyo, Japan

Yoshiyasu Ito