Hitachi, Ltd.

Hitachi-High-Technologies Corporation

Yoshiya Higuchi

Yoichi Ose

Kazuyoshi Miki

Hiroyuki Ito

Kenji Miyata

Takeshi Kawasaki

Yuko Sasaki

Tsutomu Yamamoto

Mitsushi Abe

Masatsugu Nishi

Ryuya Ando

Takuro Honda

Hiroki Sano

The active shield superconducting electromagnet apparatus includes: a main switching circuit in which first and second main coils, first and second shield coils, and a first superconducting persistent current switch are connected in series; a sub switching circuit in which a bypass circuit, in which a superconducting fault current limiter and a second superconducting persistent current switch are connected in series, are connected to a series circuit of the first main coil and the second main coil in parallel; a first closed circuit in which at least one of the first main coil and the first shield coil, and a first quench protection circuit are connected in series; and a second closed circuit in which one of the second main coil and the second shield coil, and a second quench protection circuit are connected in series.

Active shield superconducting electromagnet apparatus and magnetic resonance imaging system

In a charged-particle beam apparatus having a high-accuracy and high-resolution focusing optical system for charged-particle beam, a group of coils are arranged along a beam emission axis to extend through the contour of radial planes each radiating from the beam emission axis representing a rotary axis and each having a circular arc which subtends a divisional angle resulting from division of a circumferential plane by a natural number larger than 2 so that a superposed magnetic field may be generated on the incident axis of the charged-particle beam and the trajectory of the charged-particle beam may be controlled by the superposed magnetic field.

Corrector for charged-particle beam aberration and charged-particle beam apparatus

A charged particle generating device such as an ion implanter, a secondary ion mass spectrometer having a good mounting operability, a simple construction, good characteristics such as sensitivity, etc., owing to the fact that there is disposed a focusing electrode composed of the cylindrical electrodes disposed coaxially with each other, at least the inner electrode thereof having a plurality of openings.

Charged particle generating device and focusing lens therefor

In a secondary charged particle analyzing apparatus such as a secondary ion mass analyzing apparatus, a scanning type electron mass analyzer, etc., in order to obtain a high resolving power and a high sensitivity, trajectories of secondary charged particles are corrected by means of an accelerating lens formed in a secondary charged particle extracting section disposed within the apparatus.

Secondary charged particle analyzing apparatus and secondary charged

Charged particle accelerator and method of cooling charged particle beam

Growing community of inventors

Tokai, Japan

Yoshiya Higuchi