Canon Kabushiki Kaisha

Yoshito Yoneyama

Nobuaki Ogushi

Masaya Ogura

Hirohisa Ohta

Takeshi Miyazaki

Toshikazu Ohnishi

Kazuo Isaka

Kazumi Tanaka

Takayuki Hasegawa

Matsuomi Nishimura

Hidehito Takayama

Hidehiko Fujioka

Naoki Yuguchi

Takayuki Yagi

Isao Matsumura

Masanori Sakuranaga

Yoshiyuki Toge

Yoshiyuki Touge

Junichi Yamayoshi

Factories (-) have host computers () for monitoring industrial equipment (). Each host computer () is connected to a management host computer () on a vendor () side through the internet (). The host computer () on the factory side detects occurrence of a trouble of the industrial equipment () and notifies the vendor side of status information representing a trouble state. In response to this, the host computer () on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.

Remote maintenance system

Factories () have host computers () for monitoring industrial equipment (). Each host computer () is connected to a management host computer () on a vendor () side through the internet (). The host computer () on the factory side detects occurrence of a trouble of the industrial equipment () and notifies the vendor side of status information representing a trouble state. In response to this, the host computer () on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.

Factories () have host computers () for monitoring industrial equipments (). Each host computer () is connected to a management host computer () on a vendor () side through the internet (). The host computer () on the factory side detects occurrence of a trouble of the industrial equipment () and notifies the vendor side of status information representing a trouble state. In response to this, the host computer () on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.

A medical-instrument service providing system receives an online order for a medical instrument via a communication network from a service utilizing terminal of a medical institution, accesses a stock control server controlled by a supplier of the medical instrument, to check whether or not the on-order medical instrument is in stock in the supplier. If the on-order medical instrument is in stock in the supplier, the system instructs to deliver the medical instrument to the medical institution. If the on-order medical instrument is insufficient in stock, the system accesses a stock control server, controlled by other institution than the medical instrument, to check whether or not the instrument is in stock, via the communication network. If the on-order medical instrument is in stock, the system instructs to supply the medical instrument to the medical institution from the other institution.

Medical instrument control system

Factories ( ) have host computers ( ) for monitoring industrial equipments ( ). Each host computer ( ) is connected to a management host computer ( ) on a vendor ( ) side through the internet ( ). The host computer ( ) on the factory side detects occurrence of a trouble of the industrial equipment ( ) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer ( ) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.

A processing system includes a processing chamber, a circulating device for purifying an inside ambience gas of the processing chamber and for circulating the purified gas back into the processing chamber, a measuring device for measuring the purity of the ambience gas, and an adjusting device for adjusting the purification capacity of the purifying device in accordance with an output of the measuring device. In another form, a processing system includes a first processing chamber in which a first process is to be performed therein, a second processing chamber in which a second process is to be performed therein, and a device for introducing an ambience gas, having been used in said first processing chamber for the first process, into the second chamber for reuse thereof. The gas subsequently used in the second chamber is introduced back into the first chamber for reuse of the gas. At least a portion of the circulated gas is purified to improve its purity. A purity sensor detects the purity of gas discharged from the second chamber and, in accordance with the detection, the capacity of gas purification is adjusted.

Processing system for semiconductor device manufacture of otherwise

A processing system for processing semiconductor devices includes an adjusting device for adjusting atmospheric conditions such as the cleanness and temperature in a clean room, at least one processing device disposed in the clean room, and a control device for controlling operation of the adjusting device in accordance with an operating state of at least one of the processing devices. The invention makes it possible to highly control the air conditioning of a required location and at a required time.

Processing System and semiconductor device production method using the

A minute flow path is filled with liquid so that the liquid may be supplied from an accumulating portion. Energy is imparted to the liquid exposed outwardly of an opening in the flow path by a heat generating element or by energy application to thereby heat and gasify the liquid. Thereupon, the liquid is supplied by an amount corresponding to the gasified liquid by capillary phenomenon through the flow path, and gasification is continuously effected, whereby a flow free of pulsating flow can be formed in the flow path.

Liquid moving apparatus and measuring apparatus utilizing the same

An injection port for injecting a sample, an accumulation portion for accumulating the injected sample having a reagent carrier enclosed, a flow passage portion, having a light receiving element at a measuring position located halfway thereof, for passing a reaction fluid having reacted with the reagent in the accumulation portion therethrough, a micro-pump having a feed action of the sample fluid within the flow passage portion and which is a heat generating element provided near a nozzle downstream of the measuring position of the flow passage portion are formed integrally and intensively as a cartridge by a producing method including a semiconductor fabrication process.

Sample measuring device and sample measuring system

A particle-separating apparatus discharges a liquid drop by providing discharging energy within a receptacle for receiving a particle-suspending fluid. Thermal energy can be used to generate a bubble and discharge a liquid drop containing an individual particle to be examined from an opening in the receptacle.

Apparatus for separating or measuring particles to be examined in a

A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.

Sample supply device and sample inspection apparatus using the device

This invention measures the properties of individual particles in particle-suspended liquid by an optical technique or the like, causes the particle-suspended liquid to fall while separating the liquid into droplets containing the individual particles therein, and causes liquid droplets discharged from a nozzle to collide with the droplets from a direction differing from the direction of fall, in conformity with the properties of the particles discriminated by the measurement, so as to change the direction of fall of the falling droplets, thereby fractionating the particles.

Growing community of inventors

Kawasaki, Japan

Yoshito Yoneyama