Nippon Steel Sumitomo Metal Corporation

Nippon Steel Corporation

Sumitomo Mitsubishi Silicon Corporation

Yoshito Isei

Tomoya Kato

Masahiro Osugi

Shinichi Oshima

Toshiyuki Oyama

Ryota Ohashi

Takanori Tanaka

Hideyuki Takahashi

Tatsuro Honda

Takenori Kuramoto

Kenshiro Oie

Yasuhiro Aihara

Tokumi Hirai

The present invention provides a measuring apparatus and a measuring method in which a relative moving velocity of a target to be measured or a separation displacement of the target to be measured can be accurately measured even in a case where the target to be measured is moved. In a measuring apparatus, a relative moving velocity of a target to be measured and a separation displacement of the target to be measured can be measured in consideration of the influence of Doppler shift that occurs due to the movement of the target to be measured in an in-plane direction, and thus, even in a case where the target to be measured is moved in the in-plane direction, the relative moving velocity of the target to be measured and the separation displacement of the target to be measured can be accurately measured.

Measuring device and measuring method

The present invention provides a surface following nozzle, an observation device for a moving object surface, and an observation method for the moving object surface that can remove water in the vicinity of the nozzle while following changes in the shape and changes in the distance of a moving object. A surface following nozzle includes a nozzle that injects gas from a tip end thereof, a separating part that closes a base end of the nozzle, and an extending and contracting part that is provided at a rear side of the nozzle via the separating part, and extends and contracts along an axial direction of the nozzle. The extending and contracting part includes an elastic body that applies a forward force with respect to the nozzle.

Surface following nozzle, observation device for moving object surface, and observation method for moving object surface

A thread shape measuring apparatus includes: a first illuminating unit that has an optical axis orthogonal to a cross section including a thread axis, and illuminates the thread portion; a second illuminating unit that has an optical axis that forms an angle &#x3b8; larger than a lead angle &#x3b3; of the thread portion with respect to the direction orthogonal to the cross section and illuminates the thread portion; an image-capturing unit that has a visual axis parallel to the optical axis of the first illuminating unit, includes a telecentric lens, has a focusing position matching the cross section, and detects, out of the light emitted from the first illuminating unit or the second illuminating unit, light that has not been blocked by the thread portion to capture an image of the detected light; and an operation unit that calculates a shape of the thread portion based on the captured image.

Thread shape measuring apparatus and measuring method

Around a crankshaft (S) supported by a support device (), a first shape measuring device () to a fourth shape measuring device () are disposed, and the crankshaft (S) and the first shape measuring device () to the fourth shape measuring device () are relatively movable in an axial direction (X direction) of the crankshaft (S). The first shape measuring device () and the third shape measuring device () are disposed so as to face to one X direction and acquire partial shape information (including the other side surfaces in the X direction of counterweights (S)) of the crankshaft S, and further, the second shape measuring device () and the fourth shape measuring device () are disposed so as to face to the other X direction and acquire partial shape information (including one side surfaces in the X direction of the counterweights (S)) of the crankshaft S. This makes it possible to accurately inspect a shape of the crankshaft (S) in a short time.

Crankshaft shape inspection apparatus, system and method

The present invention provides a method for inspecting a crankshaft, which enables accurate detection of defects which occur partially in the crankshaft, such as underfills and dent flaws, by discriminating these defects from bending and torsion over an entire length of the crankshaft. The present invention includes steps of: acquiring three-dimensional point cloud data over an entire length of a measurement object region of a crankshaft S by an optical three-dimensional shape measurement device; dividing the acquired three-dimensional point cloud data to create a plurality of subregion three-dimensional point cloud data, each of the subregion three-dimensional point cloud data respectively corresponding to each of a plurality of subregions of the crankshaft along a direction parallel to the rotational center axis L of the crankshaft; translating and rotating each of the created subregion three-dimensional point cloud data to superpose each of the subregion three-dimensional point cloud data on a surface shape model of the crankshaft, such that a distance between each of the subregion three-dimensional point cloud data and the surface shape model becomes minimum; and detecting a partial defect such as an underfill of the crankshaft based on a distance between each of the subregion three-dimensional point cloud data after being superposed and the surface shape model.

Method and device for inspecting crankshaft

A method for measuring flatness of a sheet includes acquiring a pattern image by projecting a light and dark pattern composed of light portions and dark portions onto a surface of the sheet, which is traveling between adjacent rolling stands, from a projection unit situated between the rolling stands, and capturing an image of the light and dark pattern with an image capture unit situated between the rolling stands, and measuring the flatness by analyzing the acquired pattern image. Arrangement parameters L, &#x3b1;, &#x3b2;, hc and hp satisfy the following mathematical expression (1). 

Method for measuring flatness of sheet, device for measuring flatness of sheet, and production method for steel sheet

A method for measuring flatness of a sheet material in which a light and dark pattern composed by a light portion and a dark portion is projected onto a surface of the sheet material running in a longitudinal direction, a pattern image is acquired by photographing the light and dark pattern by an image pickup device having an image pickup visual field larger than a width of the sheet material, and the flatness of the sheet material is measured by analyzing the acquired pattern image. A staggered pattern is used for the projecting step and for light to be specularly reflected for receipt by the image pickup device. Calculating the flatness also includes steps of setting a shape measurement line, averaging picture element concentrations, calculating a distribution of the concentrations, and calculating the flatness based on surface shape using the distribution.

Method for measuring sheet material flatness and method for producing steel sheet using said measuring method

Measuring sheet material flatness includes projecting a bright and dark pattern made up of bright parts and dark parts onto a sheet material surface travelling in a lengthwise direction, picking up an image of pattern with image pickup device to acquire a pattern image, with the pickup device having a field of view larger than a sheet material width. The acquired pattern image is analyzed, wherein a pattern in which a bright part is disposed at a predetermined set pitch respectively in longitudinal and lateral directions is formed by an LED light at a predetermined pitch respectively in the longitudinal and lateral directions. The pattern is projected onto the surface such that the longitudinal direction of the pattern lies along a lengthwise direction of the sheet material, and the lateral direction of the pattern lies along a width direction of the sheet material.

Method for measuring flatness of sheet material and method for manufacturing steel sheet using the same

A thickness of a wafer during polishing operation is detected to accurately perform the polishing. A thickness measuring method, which measures the thickness of the wafer of waferin polishing a surface, comprises the steps of irradiating the thin film-like material during the surface polishing from a backside with probe light, measuring a reflectance spectrum with a dispersion type multi-channel spectroscope using a photodiode array which has particularly high sensitivity to light having a wavelength ranging from 1 to 2.4 &#x3bc;m, and calculating the thickness on the basis of a wave form of the reflectance spectrum. The surface polishing is performed while the thickness of the waferis measured by the above-described thickness measuring method, and the polishing is finished when the thickness of the waferreaches a target thickness.

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Tokyo, Japan

Yoshito Isei