Kyooka Co., Ltd.

Other

Ii, Noriaki

Yoshiteru Kyooka

Yutaka Adachi

Masato Abe

Keiji Igarashi

Noriaki Ii

Noriaki Li

Provided is a magnetic probe including: a support shaft; a magnetic field generator fixed to one end of the support shaft and interacting with a magnetic field formed by a magnetic marker and a geomagnetic field; and a compensation magnetic field generator fixed to the other end of the support shaft and interacting with the geomagnetic field, the magnetic field generator and the compensation magnetic field generator being configured to interact with the geomagnetic field to offset torques around a rotation center of the magnetic probe.

Magnetic probing device

A sleeve-component extracting jig according to the present invention is configured to include an engagement part on which a thread engageable with an inner circumferential surface of a sleeve component is formed, wherein a taper surface configured by cutting off crests of the thread to lower a height of the thread toward a leading end of the engagement part, and a plurality of clearance grooves open at the leading end of the engagement part and arranged at equal angular intervals in a circumferential direction of the engagement part are formed in the engagement part, a length of a radius of the engagement part at an end position of the taper surface is a sum of a length obtained by multiplying a thickness of the sleeve component by a digging ratio (20%&#x2dc;60%) and a length of an inside radius of the inner circumferential surface of the sleeve component.

Sleeve-component extracting jig

A probe is a three-layer substrate having two faces on which paired electrodes are formed at corresponding positions and guard patterns are formed around the electrodes. The guard patterns and all electrodes are driven by a common probe signal to an equal potential, thereby commonly guarding the electrodes. Based on a clamp current of each electrode, a capacitance is found to obtain gap data.

Gap sensor and gap measuring method using a capacitance measuring technique detecting or measuring gaps between conductive member surfaces

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Tokyo, Japan

Yoshiteru Kyooka