Konica Minolta, Inc.

Konica Minolta Sensing, Inc.

Minolta Company, Ltd.

Yoshiroh Nagai

Kazumi Kitajima

Toshio Kawano

Takashi Kawasaki

Koji Yamamoto

Norihiro Tateda

Toshio Norita

Norio Ishikawa

Kenji Imura

Koji Fujiwara

Satoshi Yokota

Shinji Yamamoto

Kenji Hamaguri

Yasushi Goto

Kazunari Mizuguchi

Takanobu Ojima

Akihiro Ukai

Makoto Sato

Masatake Fukunami

Yasumasa Tsukamoto

An image capture condition adjustment device () includes an acquisition means () that acquires a plurality of captured images obtained by capturing a workpiece () illuminated by an illumination device () with a camera () while moving at least one of the illumination device or the camera relative to the workpiece, and an adjustment means () that adjusts an image capture condition for the camera () in such a manner that distribution of brightness of an image is uniform for each of the plurality of captured images acquired.

Image capture condition adjustment device, image capture condition adjustment method, and program

An approximation B'f(Id,&#x3bb;) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,&#x3bb;) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(&#x3bb;) of the standard illumination light Id. Spectral power distributions Rf(Ik,&#x3bb;) of fluorescence are obtained from the spectral power distributions R(Ik,&#x3bb;) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,&#x3bb;) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R&#x2032;f(Id,&#x3bb;) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation R&#x2032;f(Id,&#x3bb;) and the spectral power distribution Id(&#x3bb;) of the standard illumination light Id, the approximation B&#x2032;f(Id,&#x3bb;) is obtained by equation (third step: #12).

Method for measuring spectral radiation characteristics of fluorescence whitened sample, and device for measuring spectral radiation characteristics of fluorescence whitened sample

Creating a model calibrating spectral apparatus having an optical system that converts light to be measured into a spectrum, and a light-receiving sensor including a plurality of sensors that outputs signals, the sensors include sensors that output signals indicating respective energy amounts of a plurality of wavelength components. The model shows where a linear function of an indicator indicating a mechanical error in the spectral apparatus, expresses deviation of an indicator indicating spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor. The method comprises: a) acquiring reference spectral sensitivity; b) acquiring an indicator indicating the reference spectral sensitivity of the sensor acquired at a); and c) creating the model where the linear function of the mechanical error indicator expresses deviation of the spectral sensitivity indicator from the indicator indicating the reference spectral sensitivity of the sensor, acquired at b).

Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus

A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.

Wavelength shift correction system and wavelength shift correction method

A system and method include a wavelength shift correction light source emitting wavelength shift correction emission-line light and a spectrometer including: a spectroscopic unit receiving with photoelectric conversion elements rays of dispersed spectral light obtained by dispersing incident light based on wavelength, and outputs electrical signals corresponding to light intensities of the rays of dispersed spectral light; and a unit that measures temperature of the spectroscopic unit. When the wavelength shift correction emission-line light is measured as the incident light with the spectrometer, this system and method determine wavelength shift correction time emission-line wavelength corresponding to wavelength shift correction emission-line light, based on electrical signals from photoelectric conversion elements receiving wavelength shift correction emission-line light, and the measured temperature. The system and method determine wavelength variation from the difference between determined wavelength shift correction time emission-line wavelength and known emission-line wavelength of the wavelength shift correction emission-line light.

Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.

Spectrocolorimetric device includes a light source, a light-receiving unit, a calculation unit, a storage unit, an acquisition unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface and measures a spectroscopic spectrum relating to the reflected light. The calculation unit calculates a first spectral reflectance from the spectroscopic spectrum. The storage unit stores relationship information indicating a relationship between a reflectance and a reflectance difference for each wavelength. The acquisition unit acquires reflectance difference for each wavelength between the first spectral reflectance acquired using the spectrocolorimetric device and a second spectral reflectance acquired using a destination-of-conversion spectrocolorimetric device on the basis of the first spectral reflectance and the relationship information. The conversion unit converts the first spectral reflectance into the second spectral reflectance by adding or subtracting the reflectance difference for each wavelength acquired by the acquisition unit to or from the first spectral reflectance.

Spectrocolorimetric device and conversation rule setting method

In order to provide a technique by which a highly-accurate conversion rule of measurement values between different spectrocolorimetric devices can be easily set, the spectrocolorimetric device includes a light source, a light-receiving unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface of an object according to irradiation of the object with illumination light emitted from the light source and measures a spectroscopic spectrum of the reflected light. The conversion unit calculates a spectral reflectance that can be acquired by another spectrocolorimetric device from the spectroscopic spectrum by using a calibrated spectral sensitivity of the other spectrocolorimetric device different from the spectrocolorimetric device and the spectroscopic spectrum.

Spectrocolorimetric device and spectral reflectance calculating method

A color measurement device obtains edge information based on an image of a color chart. The color measurement device statistically processes the edge information to obtain edge statistic information. Based on the edge information and the edge statistic information, the color measurement devices obtains the position of each patch of a number of patches of the color chart.

Colorimeter and colorimetry method

A color measurement device acquires an image of a relative position calibration chart. The relative position calibration chart includes a calibration figure having a given calibration feature that has a position that is detectable along at least one of a first and a second direction. A color measurement of the relative position calibration chart is performed. Relative position relationship-related information is derived based on the calibration feature in the image of the relative position calibration chart and the calibration feature in the color measurement of the relative position calibration chart. A color of each patch of a number of patches of a color chart is measured at a position corresponding to one of the patches while correcting the position of the patch based on the position relationship-related information.

Colour measurement device and colour measurement method

In this color measurement device and method, an entire image and a partial image of a color chart are acquired, respectively, during conveyance of the color chart by a conveyance unit and during re-conveyance of the color chart by the conveyance unit, and an amount of positional deviation of the color chart occurring between the conveyance and the re-conveyance is derived based on the acquired entire and partial images. Then, a color of each of a plurality of patches of the color chart is measured by a color measuring unit, while a measurement position of the color measuring unit is corrected according to the derived positional deviation amount.

Color measurement device and color measurement method

A Fourier transform spectrometer (Da) of the invention extracts, in generating an integrated interferogram obtained by integrating a plurality of interferograms, an output of an interferometer () within a predetermined range according to positioning information of a center burst in an interferogram measured at a time before measurement of an interferogram at the present time.

Fourier transform spectrometer and fourier transform spectroscopic method

A vital information measuring device includes: a flexible substrate including a functioning part which is mounted thereon; and an outer member for covering the flexible substrate. The functioning part has: a sensor section for sequentially measuring a parameter relating to certain vital information on a subject; a circuit section for performing a predetermined process with respect to a measurement signal outputted from the sensor section; a memory section for storing therein the measurement signal or measurement data after the process by the circuit section; a display section for displaying thereon certain information relating to the measurement; and a power source section for supplying a drive voltage to the respective sections of the functioning part.

Vital information measuring device

A pulse wave data analyzing method includes successively detecting bottom and top peak values of pulse wave data along a time axis, calculating successive bottom-to-top amplitude values along the time axis, and comparing first and second peak-to-peak amplitude values occurring in succession along the time axis. If the ratio of the second peak-to-peak amplitude value to the first peak-to-peak amplitude value is smaller than a preset threshold, the bottom and top peak values related to the second peak-to-peak amplitude value are classified as temporarily erased data. The second peak-to-peak amplitude value is compared with a third peak-to-peak amplitude value occurring immediately thereafter and, if the ratio between the second and third peak-to-peak amplitude values is larger than the threshold, the temporarily erased data is restored. If the ratio between the second and third peak-to-peak amplitude values is not larger than the threshold, the temporarily erased data is completely erased.

Method, system and program product for analyzing pulse wave data

A biometric information measuring apparatus has a storage device for storing data concerning a biometric signal or biometric information derived from the biometric signal in association with position information indicating the current location of a sensor unit of the apparatus. Since the biometric information measuring apparatus provides the position information acquired when the data on the biometric signal or the biometric information was obtained, one can know the location and behavior of a subject at the time of measurement and exactly analyze the biometric information on the subject.

Growing community of inventors

Nishinomiya, Japan

Yoshiroh Nagai