Nkk Corporation

Nippon Kokan Kabushiki Kaisha

Yoshiro Yamada

Takamitsu Takayama

Takao Miyazaki

Takeo Yamada

Takeshi Yamazaki

Shigeru Inoue

Isamu Komine

Akira Kazama

Takahiko Oshige

Kazuo Sano

Genji Kanatani

Ichiro Kikuchi

Akihiko Inoue

Yasushi Kaneda

Hideo Nakamura

Masaki Komatani

Masashi Edahiro

Takafumi Yoshikawa

Masao Hiroko

Mitsuo Yamasaki

Takeshi Murai

Hideaki Mizukami

Keiichi Miyoshi

Hirofumi Nakamura

Kazusi Miyamoto

Masao Doi

Yuji Adachi

Shirou Takene

Shuichiro Nomura

Zenkichi Yamanaka

Yoshimi Komatsu

Toshiaki Hosoda

A temperature measuring device includes an optical fiber, a metallic protective tube covering the optical fiber, and a heat insulation coating covering the metallic protective tube such that the optical fiber is covered with the metallic protective tube and the heat insulation coating to form a double-covered optical fiber. The heat insulation coating contains carbon particles as an additive. In addition, a radiation thermometer is connected to the double-covered optical fiber, and a tip of the double-covered optical fiber forms a temperature measuring element for collecting and transmitting radiation to the radiation thermometer.

Temperature measuring device

The present invention relates to improvement of an image processing method and apparatus which senses the state of a test object as image information by a sensor or sensors, outputs a plurality of image information signals and decides or displays said plurality of the image information signals, said image processing method and apparatus characterized by summing said plurality of the image information signals and deciding or processing a plurality of summed signals, said method and appratus permitting the precise sensing of the lightness tone and pattern of the test object.

Method and apparatus for processing image

A method and apparatus for measuring a true temperature using a consumable optical fiber, wherein received light emitted from a high temperature liquid is divided into two light beams through a branching filter. A light of a first wave band from a first light beam of the two light beams is detected by a first radiation thermometer, and the light of the first wave band is converted into temperature to output a first temperature. A light of a second wave band from a second light beam of the two light beams is detected by a second radiation thermometer, and the light of the second wave band is converted into temperature to output a second temperature. The true temperature is then calculated by using two first temperature-conversion-parameters inherent to the first radiation thermometer, a first transmission loss index in the first wave band by the first radiation thermometer, the outputted first temperature from the first radiation thermometer, two second temperature-conversion-parameters inherent to the second radiation thermometer, a second transmission loss index in the second wave band by the second radiation thermometer, the outputted second temperature from the second radiation thermometer.

Method and apparatus for measuring temperature using an optical fiber

An apparatus and method for measuring a temperature of a high temperature liquid contained in a furnace. An optical fiber covered with a metallic tube is inserted through a passageway inside a nozzle arranged on a furnace wall of the furnace. The nozzle communicates with an interior of the furnace containing the liquid, and gas is supplied into the passageway inside the nozzle to prevent the nozzle from clogging. The metal-covered optical fiber is fed through the passageway inside the nozzle into the liquid such that spectral light radiated from the liquid enters a tip of the metal-covered optical fiber and is propagated therealong. The temperature of the liquid is determined by a radiation thermometer, coupled to the metal-covered optical fiber, based on the spectral light propagated along the metal-covered optical fiber.

Apparatus and method for measuring a temperature of a high temperature

Ellipsometer and method of controlling coating thickness therewith

Circularly polarized light caused to be incident on a film surface is converted into three light beams by optical flats to obtain electrical signals corresponding to the intensities of the respective light beams. Two ellipsometric parameters .psi. and .DELTA. are claculated from these three electrical signals.

Film thickness-measuring apparatus

A linearly polarized light beam is applied to the surface of a film and is reflected therefrom. The beam is then split into three light beams by three or four optical flats. These light beams are applied to photoelectric conversion devices after passing through analyzers with fixed analyzing angles. The photoelectric conversion devices convert the beams into electric signals representing the intensities of these light beams. Two ellipsometric parameters .psi. and .DELTA. are calculated from these three electric signals.

Film thickness-measuring apparatus using linearly polarized light

Growing community of inventors

Kawasaki, Japan

Yoshiro Yamada