Mitsubishi Denki Kabushiki Kaisha

Yoshio Yamane

Kazuo Yoshida

Hidenobu Murakami

Ryo Suzuki

Hiroshi Koizumi

Masato Saito

Shigeo Sasaki

Seigo Hiramoto

Masahiko Sakamoto

Yoshimi Kinoshita

Soichiro Okuda

Tetsuya Shiroishi

Hiroaki Tobuse

Takashi Ishii

Yasushi Hisaoka

Fumiharu Yabunaka

Kouichi Sakurai

Image display apparatus

An inspection method and an inspection apparatus for the component members of the cathode-ray tube are disclosed. An inspection apparatus composed of normal members other than an object of inspection is prepared at the time of inspecting the phosphor screen of the screen panel, the electron gun or the shadow-mask constituting the cathode-ray tube. In advanced to assembling the cathode-ray tube, the object of inspection is mounted on the inspection apparatus, so that the conformance or rejection of the object of inspection is decided from the illuminated condition of the phosphor screen by irradiating electron beams thereon.

Method of inspection for cathode-ray tube component members and

A charged-particle distribution measuring apparatus includes a particle passing member having a plurality of through-holes through which portions of a beam of charged particles can pass, a particle trapping member for trapping charged particles that have passed through the through-holes, a recoil particle trapping member disposed between the particle passing member and the particle trapping member, and a mechanism for moving the members to measure the spatial distribution of the charged particle beam. Preferably, the through-holes in the particle passing member are uniformly distributed in a checkerboard pattern. The movement of the members permits measurement of the currents produced by the charged particle beam at various intervals between the locations of the through-holes at the beginning of the measurement. The measurement of the charged particle beam intensity at positions across through the beam, rather than at fixed locations within the beam, improves the resolution of the measured distribution. The apparatus can be employed with positively and negatively charged beams and is useful in ion implantation.

Charged-particle distribution measuring apparatus

A method and apparatus for detecting and regulating a focused condition of an electron beam emitted from an electron gun of an electron beam welding apparatus. An electron beam of a low intensity is first directed onto the workpiece. The coil current of an electromagnetic condenser lens used to focus the electron beam is then varied linearly. The resulting electrons and other radiation produced from the workpiece as a result of this irradiation is then sensed and a signal corresponding to the intensity thereof is produced. The focus position of the electron beam is determined in accordance with variations in this signal.

Method and apparatus for detecting and regulating position of welding

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Amagasaki, Japan

Yoshio Yamane