Hitachi, Ltd.

Renesas Technology Corp.

Yoshio Takamine

Yoshiharu Kazama

Yoshiaki Kinoshita

Takayuki Nakagawa

Shunsuke Miyamoto

Kei Suzuki

Shigeo Nagashima

Koichiro Omoda

Kaname Yamasaki

Yoshio Miki

Tsuguo Shimizu

Masayuki Miyoshi

Toshihiko Sugita

Test functions are expanded by adopting a self test part, and circuit scale is reduced by adding the self test part. A semiconductor integrated circuit includes a memory that includes plural memory banks and is accessed by specifying a bank address, an X address, and a Y address, and a self-test part that tests the memory in response to commands. The self-test part has an address counter covering plural addressing modes that are different in the updating of X addresses, Y addresses, and bank addresses. A variety of addressing modes provided expand BIST-based test functions.

Semiconductor integrated circuit

A method for automatically generating a behavior model description of a circuit that is used with a simulator and a logic verification apparatus. An interface description defining the state transition of input/output signals of a logic circuit module at clock cycle accuracy and a functional description defining the processing function of signals or data of the logic circuit module as a program function are read, and a logic behavior model description of a circuit defining in-circuit behavior and a state transition of input/output signal at clock cycle accuracy is automatically generated.

Method for generating behavior model description of circuit and apparatus for logic verification

For simulation evaluation of combinational logic, changes in input signals are reserved for events occurring with respect to every element of the combinational logic circuit or of a partial circuit within the logic circuit according to demand timing. To inhibit wasteful processes, when the output value of a pertinent element or partial circuit is required by an element included in another partial circuit, i.e. when a demand has been sensed, only then are the events which occurred before evaluation.

Logic simulation method

A wiring route is determined between terminals on an integrated circuit on the basis of information concerning the terminals and areas of the integrated circuit through which a wire can be routed. A mesh memory holds information of mesh points of a wiring area partitioned in a mesh-like pattern. A wavefront memory holds information concerning mesh points constituting the leads of searching point arrays. An expansion point extracting unit selects a source point from the mesh points for a succeeding search from the leading mesh points on the basis of costs. Addresses and costs for mesh points neighboring the source point are calculated. A searching point register holds information concerning the mesh points obtained through the calculation. A determination is made of whether or not the mesh points placed in the searching point register can be searched, and if so they are written to the mesh memory. Duplicate information stored in the searching point register is eliminated. It is then determined whether or not the mesh points corresponding to the terminals to be wired are contained in the searching point register. If so, the wiring route is determined and the process concluded.

Apparatus for wire routing of VLSI

A method of logic simulation for simulating operation of a logic circuit by using basic signal values corresponding to states of output signals of elements of the logic circuit to be simulated and expanded signal values including the basic signal values. The logic circuit to be simulated is divided into a portion to be simulated by using the basic signal values and the expanded signal values and a portion to be simulated by using the basic signal values without using the expanded signal values. The elements for which definition of calculation method for output signal values for the input signal values including the expanded signal values is not easy are included in the latter portion, and other elements are included in the former portion. A virtual signal conversion element for converting the expanded signal into the basic signal is provided at a position where a signal is sent from the former portion to the latter portion so that the expanded signal value outputted from the element of the former portion is converted into the basic signal value before it is sent to the element of the latter portion.

Method and apparatus for logical simulation

A vector processor has a discriminator for determining in one machine cycle of an operation unit whether a bit pattern of elements of vector data meets a predetermined condition or not. An output of a register having a predetermined value loaded only into bits to be extracted from the vector data and each of the elements of the vector data are ANDed or ORed so that the bit pattern is determined. The operation and determination are sequentially carried out in one machine cycle.

Vector processor

A computer implemented logic simulation method, for inspecting logical operations of large scale logic circuits, computes a variation of an output of at least one latch in a clock synchronized logic circuit. The clock-synchronized logic circuit contains a combination logic circuit and a plurality of logic gates. Each of the logic gates have at least one input signal and several other inputs connected to clocking signal sources of different phases. The latch is activated by the rise or fall of the clock signals for holding the output from the combination logic circuit. The method thus implements sampling instants of the output for ascertaining the logical operations of the large scale circuits.

Circuit simulation method with clock event suppression for debugging LSI

Herein disclosed is an automatic design system for automatically generating a data structure, which is only implicitly expressed by a logic specification description, by deriving, in case a logic system has data structures of similar constructions, one data structure from the structure description and transfer behavior description of the other data structure.

Automatic logic design system

In response to the execution of a single loading instruction, the front half and the rear half of a designated vector may be stored in respective vector registers in a single processor operation. For this purpose, a data distribution circuit is interposed between a group of vector registers and a vector data storage for feeding the vector data read out from the storage to a first vector processor designated by an instruction without shifting and for shifting the respective components of the read-out vector data and feeding the shifted components to a second vector register designated by the instruction.

Growing community of inventors

Kokubunji, Japan

Yoshio Takamine