Ishida Co. Limited

Yoshinori Tarumoto

Osamu Hirose

Norio Kawanishi

Shoko Tajiri

Atsushi Iwai

Emi Mizuno

Kazuhiro Suhara

Makoto Nakatani

Hironori Tsutsumi

Kohei Hayashida

Tsutomu Okamoto

Atsushi Yamakawa

Akihiro Maenaka

Shoji Suda

Youichirou Abe

Yoshiki Fujita

Taiga Nada

Tomoya Maeno

Hajime Sugiuchi

Heinosuke Shiotani

A weighing apparatus includes: a transport unit capable of transporting an article; a weighing unit connected to the transport unit and configured to output an original signal related to a weight; and a weighing control unit configured to output a weighing value of the article by processing the original signal, wherein the weighing control unit is configured: to determine whether or not to adjust a zero point on the basis of a determination signal obtained by applying a first filter to the original signal; to generate an adjustment signal obtained by applying a second filter having more stages than the first filter to the original signal or the determination signal in a case where it is determined that the zero point is to be adjusted; and to perform adjustment of the zero point on the basis of the adjustment signal.

Weighing apparatus

An inspection device inspects of goods that include plural articles that sometimes overlap each other. An X-ray inspection device irradiates goods containing plural articles having a predetermined shape and inspects the goods on the basis of inspection images obtained from radiation that has passed through the goods or radiation that has reflected off the goods. The X-ray inspection device includes a storage component, a learning component, and an inspection component. The storage component stores, as teaching images, at least the inspection images of the goods that are in a state in which the plural articles overlap each other. The learning component acquires, by machine learning using the teaching images stored in the storage component, features relating to the goods that are in a state in which the plural articles overlap each other. The inspection component inspects the goods using the features that the learning component has acquired.

Inspection device

A food production management system that manages a food production process group having a plurality of production processes is disclosed. The food production management system includes a first acquisition unit and an output unit. The first acquisition unit acquires throughputs of each of the plurality of production processes. The output unit outputs first information. The first information includes information representing the throughputs of each of the plurality of production processes.

Food production management system

Ad. X-ray inspection apparatus includes a conveyance unit, an X-ray radiation unit, an X-ray detection, unit, and an image processing unit. The X-ray detection unit has a plurality of direct conversion-type X-ray detection element arrays disposed, side-by-side in rows along a direction intersecting both a conveyance direction in which an object is conveyed by the conveyance unit and a radiation direction in which X-rays are radiated by the X-ray radiation unit The image processing unit has an edge detection unit configured to carry out edge detection processing on an X-ray transmission image to generate an edge detected image, a horizontal direction gradation unit configured to carry out horizontal direction gradation processing on the edge detected image to generate a horizontal direction gradation linage, and a synthesizing unit configured to synthesize the X-ray transmission image and the horizontal direction gradation image to generate a post-processing X-ray transmission image.

X-ray examination device

An optical inspection apparatusincludes a light radiation unitconfigured to radiate light to an article, a light detection unitconfigured to detect transmitted light of the light radiated to the article, and a support unitconfigured to support the light radiation unitand the light detection unitin a cantilever manner. An inspection region of the articleby the light is exposed to an ambient atmosphere.

Optical inspection device

Growing community of inventors

Ritto, Japan

Yoshinori Tarumoto