Ricoh Company, Ltd.

Shibaura Mechatronics Corporation

Yuki Gosei Kogyo Co., Ltd.

Canon Kabushiki Kaisha

Covalent Materials Corporation

Toshiba Ceramics Co., Ltd.

Ricoh Technology Research, Inc.

Yoshinori Hayashi

Seizo Suzuki

Daisuke Ichii

Kohji Sakai

Naoki Miyatake

Takeshi Ueda

Tomohiro Nakajima

Hiromichi Atsuumi

Naoto Watanabe

Hideki Mori

Taira Kouchiwa

Kazuyuki Shimada

Makoto Hirakawa

Nobuaki Kubo

Magane Aoki

Kenichi Takanashi

Satoru Itoh

Shunichi Sato

Atsushi Kawamura

Yukio Itami

Kenichiroh Saisho

Hiroyuki Suhara

Tadashi Nakamura

Mitsumi Fujii

Takao Yamaguchi

Taku Amada

Kouji Masuda

Tatsuya Ito

Nobuyuki Arai

Koji Hirakura

Seiichiro Matsumoto

Yukihisa Yokoyama

Yoichi Mikami

Toyoki Sato

Hiroshi Wakaba

Koichi Miyazono

Yoko Ono

Eiji Mochizuki

Akihiro Itoh

Koji Izunome

Tomoya Ohsugi

Hiroyoshi Shouji

Kei Hara

Kenichiro Saisho

Masahiro Soeda

Yasutaka Izumi

Masaaki Ishida

Naoto Shiraishi

Kensuke Masuda

Yasuhiro Nihei

Koji Masuda

Akihisa Itabashi

Yutaka Ebi

Akira Kojima

Sadayuki Iwai

Hisao Shirasawa

Kazunari Tonami

Ikuko Yamashiro

Osamu Endo

Yuichiro Kanoshima

Yukito Satoh

Masako Yoshii

Junichi Yazawa

Takeki Kogawa

Masao Kawamura

Miyuki Shimizu

Kazuhiko Hamatani

Hiroyuki Naraidate

Kazunori Watanabe

Atsufumi Omori

Koichi Hamada

Kazunori Bannai

Satoshi Tsuchiya

Hitoshi Nishitani

Koji Okawa

Hiroyoshi Funato

Hiroshi Akiyama

Masaaki Furuya

Nobuaki Ono

Nobuo Kobayashi

Yu Narita

Makoto Inamoto

Tomotaka Uekusa

Daisuke Imaki

Yasuhiro Naoe

Takeshi Senda

Koichi Sasaki

Hiromichi Isogai

Eiichi Tanaka

Dai Miyauchi

Yoshiaki Kurokawa

Hiroyuki Okuwaki

Hironobu Mifune

Hiroyuki Tanabe

Takayuki Ohsawa

Shozo Kawasaki

Ryouji Hirai

Yasushi Watanabe

Akimasa Hori

Hideaki Takano

A laser processing system includes: a first light irradiator including: a first light emitter to emit first laser light; and a first light scanner to scan a first region of a workpiece with the first laser light emitted from the first light emitter; a second light irradiator including: a second light emitter to emit second laser light; and a second light scanner to scan a second region different from the first region of the workpiece with the second laser light emitted from the second light emitter. The first light irradiator emits the first laser light to the first region of the workpiece in a first irradiation direction, the second light irradiator emits the second laser light to the second region of the workpiece in a second irradiation direction opposite to the first irradiation direction.

Laser processing system and light irradiator

An electronic apparatus including an imaging unit, an operation unit, an output unit, and a control unit, wherein the control unit outputs a sound relating to a first warning using the output unit, in a case where a condition for issuing the first warning is satisfied, wherein the control unit stops outputting the sound relating to the first warning, in a case where an instruction is received by the operation unit, wherein the control unit doesn't output the sound relating to the first warning even when the condition for issuing the first warning is satisfied, in a case where the output of the sound relating to the first warning is stopped, and wherein the control unit outputs a sound relating to a second warning, when a condition for issuing the second warning is satisfied, in a case where the output of the sound relating to the first warning is stopped.

Electronic apparatus, control method, and storage medium

A HUD device comprising a display device for scanning with light emitted by a light source (e.g., an LD) an optical element array (e.g., a micro lens array) including multiple optical elements (e.g., micro lenses) to form an image and for projecting the light that has formed the image. The display device includes a control unitthat is capable of changing output power of the light In this case, it is possible to provide a display device that is capable of adjusting luminance of an image while controlling against luminance unevenness of the image from occurring.

Laser scanning display with luminance adjustment

A substrate treatment apparatus which can more efficiently regenerate phosphoric acid which is able to be returned to etching treatment along with such etching treatment as much as possible without using a large facility, that is, a substrate treatment apparatus which treats a silicon substrate W on which a nitride film is formed by a liquid etchant which contains phosphoric acid, which comprises an etching treatment unit (the spin treatment unit) which gives a suitable quantity of liquid etchant to each substrate which is fed one at a time so as to etch the substrate and remove the nitride film, a phosphoric acid regenerating unit (the spin treatment unit) which mixes liquid etchant used for treatment of one substrate and a suitable quantity of liquid hydrofluoric acid for the amount of the used liquid etchant under a predetermined temperature environment to regenerate the phosphoric acid, and a phosphoric acid recovery unit (the pump, phosphoric acid recovery tank, and pump) which returns the phosphoric acid which was obtained by the phosphoric acid regenerating unit to the liquid etchant to be used at the etching treatment unit.

Substrate treatment method and substrate treatment apparatus

An optical scanning unit includes a rotatable multi-faceted mirror having a plurality of faces reflecting light flux emitted from a light source to scan a scanning area in a main scanning direction. A width of the light flux striking the rotatable multi-faceted mirror is smaller than a length of a face of the rotatable multi-faceted mirror. The entire of light flux striking the rotatable multi-faceted mirror is reflected at a first face when the light flux reflected by the rotatable multi-faceted mirror is directed to the center portion of the scanning area. A part of the light flux striking the rotatable multi-faceted mirror is reflected at the first face while the remaining of the light flux is reflected at a second face when the light flux reflected by the rotatable multi-faceted mirror is directed to a least one of the two end portions of the scanning area.

Optical scanning unit and image forming apparatus

If the picture identifier of a first frame and the picture identifier of a second frame match, a rewriting unit rewrites the picture identifier and the slice type of the first frame.

Image processing apparatus, method of controlling the same, and recording medium

A scanning unit in an image forming apparatus includes a light source, a coupling lens, an aperture, an image forming lens, and a polygon mirror. The light source includes a plurality of surface-emitting lasers. The coupling lens, the aperture, and the image forming lens are arranged on the optical path of light beams emitted by the light source. The polygon mirror deflects light beams of an image formed by the coupling lens towards a photosensitive drum for scanning. The focal length of the image forming lens in a sub-scanning direction is set to be equal to or smaller than an optical path length between the image forming lens and the aperture.

Image forming apparatus and scanning unit to scan a target surface using light fluxes

An optical scanning apparatus includes a light source; and a rotational polygon mirror having N reflecting surfaces, the rotational polygon mirror being configured to reflect a light flux emitted from the light source so that a scanning surface is scanned along a main-scanning direction with reflected from the rotational polygon mirror. A width of the light flux incident on the rotational polygon mirror in a direction corresponding to the main-scanning direction is smaller than a width of each reflecting surface of the rotational polygon mirror in the direction corresponding to the main-scanning direction.

Optical scanning apparatus and image forming apparatus utilizing a rotational polygon mirror

A surface-emission laser array comprises a plurality of surface-emission laser diode elements arranged in the form of a two-dimensional array, wherein a plurality of straight lines drawn perpendicularly to a straight line extending in a first direction from respective centers of the plurality of surface emission laser diode elements aligned in a second direction perpendicular to the first direction, are formed with generally equal interval in the first direction, the plurality of surface-emission laser diode elements are aligned in the first direction with an interval set to a reference value, and wherein the number of the surface-emission laser diode elements aligned in the first direction is smaller than the number of the surface-emission laser diode elements aligned in the second direction.

Surface-emission laser array, optical scanning apparatus and image forming apparatus

A feature analysis apparatus which enables visual confirmation of features of an inspected object and which enables limitations on the degree of freedom of classification based on the features to made relatively smaller is provided. It acquires inspected object information of an inspected object (S), analyzes the inspection information to determine values of feature parameters of each of the plurality of layers (Sto S), uses values of the plurality of feature parameters and their corresponding directions for each of the plurality of layers to generate a single parameter vector (Sto S), converts the parameter vector to a layer vector which is a 3D vector in a predetermined (Sto S), and couples the plurality of layer vectors obtained for the plurality of layers in the order of the layers and generates a set of coordinate values of the plurality of nodes obtained in the 3D space as feature information of the inspected object (S).

Feature analyzing apparatus for a surface of an object

A deflector deflects a light beam from a light source. A scanning optical system focuses the light beam deflected by the deflector. An image carrying member is located at a focal position of the light beam and includes a surface that is scanned in a main scanning direction with the light beam focused by the scanning optical system. One pixel of an image is formed by a plurality of light spots having different focal positions in at least a sub-scanning direction. At least one light spot from among the light spots is formed on the surface of the image carrying member at a scan timing different from those of rest of the light spots.

Image forming apparatus

An optical scanning device that scans a scanning surface with a light beam includes a light source that emits the light beam and a pre-deflector optical system that includes at least one diffractive optical element including a diffraction surface having no power at room temperature. The diffraction surface has a multi-step shape having a plurality of zone surfaces substantially perpendicular to an optical axis and a plurality of step surfaces each adjacent to each of the zone surfaces. On a cross sectional plane of the diffraction surface including the optical axis, each of the zone surfaces and each of the step surfaces makes an obtuse angle.

Optical scanning device and image forming apparatus

A substrate surface inspection apparatus and method enabling judgment and analysis of the state of even portions of a substrate supported by supports using a captured image are provided. A support mechanismis used where positions of arrangement of substrate support positions along the direction perpendicular to a scan direction by a plurality of first supportstoare set outside the image capturing ranges of the substrateby the imaging unitsat the first relative position and inside the common image capturing range and where positions of arrangement of substrate support positions along the direction perpendicular to the scan direction by the plurality of second supportstoare set outside the image capturing ranges of the substrate by the imaging units at the second relative position and inside the common image capturing range. The surface of the substratesupported by the plurality of first supports is scanned and captured by the imaging units at the first relative position, the imaging units are moved to the second relative position, then the surface of the substratesupported by the plurality of second supports is scanned and captured by the imaging units at the second relative position.

Substrate surface inspecting apparatus and substrate surface inspecting method

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Kanagawa, Japan

Yoshinori Hayashi