Oji Holdings Corporation

Yoshimune Okuyama

Tadakazu Ishiwata

Masahiro Nakata

Tatsuji Ishida

Akihiro Kakehi

Takeshi Tominaga

Yoshikazu Fujishiro

Michiko Sueyoshi

A biaxially stretched polypropylene film which has a thickness of from 1.0 μm to 3.5 μm, a tensile fracture stress at 135° C. of 70 MPa or more in a first direction, and a difference between the tensile fracture stress at 125° C. in the first direction and the tensile fracture stress at 135° C. in the first direction of from 0 MPa to 15 MPa (inclusive).

Biaxially stretched polypropylene film, metallized film, metallized film roll and film capacitor

A polypropylene film which is capable of suppressing blocking in a rolled polypropylene film. The polypropylene film has a first surface and a second surface, contains a polypropylene resin as a main component, and is configured such that: the Svk value (SvkA) of the first surface is 0.005 μm or more and 0.030 μm or less; the Spk value (SpkA) of the first surface is more than 0.035 μm and 0.080 μm or less; the Svk value (SvkB) of the second surface is 0.005 μm or more and 0.030 μm or less; and the Spk value (SpkB) of the second surface is 0.015 μm or more and 0.035 μm or less.

Polypropylene film, metal layer-integrated polypropylene film, film capacitor and film roll

A polypropylene film which is capable of suppressing blocking in a rolled polypropylene film. The polypropylene film has a first surface and a second surface, contains a polypropylene resin as a main component, and is configured such that: the Svk value (SvkA) of the first surface is 0.005 &#x3bc;m or more and 0.030 &#x3bc;m or less; the Spk value (SpkA) of the first surface is more than 0.035 &#x3bc;m and 0.080 &#x3bc;m or less; the Svk value (SvkB) of the second surface is 0.005 &#x3bc;m or more and 0.030 &#x3bc;m or less; and the Spk value (SpkB) of the second surface is 0.015 &#x3bc;m or more and 0.035 &#x3bc;m or less.

A polypropylene film which has a crystallite size of not more than 12.2 nm, the crystallite size being determined using Scherrer's equation from a full width at half maximum of the reflection peak from (040) plane of &#x3b1; crystal measured by a wide-angle X-ray diffraction method, and a volume resistivity of not lower than 6&#xd7;10&#x3a9;&#xb7;cm, the volume resistivity being calculated in accordance with equation I from a current value that is measured 1 minute after applying a voltage at a potential gradient of 200 V/&#x3bc;m in an environment at 100&#xb0; C. Equation I: volume resistivity=[(effective electrode area)&#xd7;(applied voltage)]/[(polypropylene film thickness)&#xd7;(current value)].

Polypropylene film, metal layer-integrated polypropylene film, and film capacitor

A biaxially stretched polypropylene film including a polypropylene resin and satisfying the following: (a) the crystallite size S, which is determined using the Scherrer equation from the full width at half maximum of the &#x3b1;-crystal (040) plane reflection peak as measured by wide-angle x-ray diffraction after treatment for 200 hours at 105&#xb0; C., is not more than 12.9 nm; and (b) the planar orientation coefficient &#x394;P, which is calculated from the birefringence values &#x394;Nyz and &#x394;Nxz with respect to the thickness direction as determined by optical birefringence measurement after treatment for 200 hours at 105&#xb0; C., is at least 0.013 (&#x394;P=(&#x394;Nyz+&#x394;Nxz)/2).

Biaxially stretched polypropylene film, metallized film for capacitors, and capacitor

The present invention relates to a biaxially stretched polypropylene film for capacitor. The biaxially stretched polypropylene film for capacitor of the present invention can suppress an increase in tan &#x3b4; and a decrease in the electrostatic capacitance even when the capacitor is used at a high voltage and an elevated temperature for a long duration.

Biaxially stretched polypropylene film for capacitors, metallized film, and capacitor

A film for a capacitor having a plurality of layers, the film for capacitors satisfying the following relational expression (1): Cmo/Cmu&#x2265;1.1 wherein Cmu is an oxygen gas permeability coefficient of the film for the capacitor, and Cmo is an oxygen gas permeability coefficient of an equivalent film that would be obtained if the film for the capacitor were to be formed as a uniform single layer, and having a thickness of 1 to 35 &#x3bc;m.

Growing community of inventors

Tokyo, Japan

Yoshimune Okuyama