Arkray, Inc.

Matsushita Electric Industrial Co., Ltd.

Yoshimitsu Morita

Yoshiharu Sato

Yasuhide Kusaka

Yoshimi Oura

Teppei Shinno

Shigeru Doi

The present invention relates to an analytical tool () comprising a substrate (), a capillary () which is formed on the substrate () and into which a sample liquid is to be loaded by movement of the sample liquid in the capillary. The substrate () is provided with a liquid movement preventer for preventing the sample liquid loaded into the capillary () from moving further. Preferably, the liquid movement preventer includes a stepped portion (B) projecting from the substrate or a recess provided at the substrate.

Analytical tool

The present invention relates to a test tool (X) attached to an analyzing device () for analyzing a sample. The test tool (X) includes a pinching portion () for attachment to the analyzing device () or removal from the analyzing device (). The pinching portion () may include recesses or projections.

Analyzing tool with knob part

A method for measuring a concentration of a specific component includes the steps of: supplying a sample fluid to a reaction field holding a reagent; obtaining a single or a plurality of leak currents for correction, through a measurement of electric current made once or a plurality of times without applying a voltage to the reaction field; obtaining a single or a plurality of electric currents for calculation, through a measurement of electric current made once or a plurality of times while applying a voltage to the reaction field; and calculating a concentration of a specific component in the sample fluid, based on the single or the plurality of values for correction and the single or the plurality of values for calculation.

Method and apparatus for measuring specific component

An analyzer (A) includes a measurer () for measuring an electro-physical quantity of a sample, and an acceleration measurer () for computing the acceleration of change of the electro-physical quantity such as a current measured by the measurer (). The fail determination as to whether or not a predetermined condition necessary for performing analysis of the sample is satisfied is made based on the acceleration computed by the acceleration measurer (). As a result, the fail determination in the analysis process of the sample can be performed accurately.

Fail judging method for analysis and analyzer

An analyzer (A) includes a current measurer () for measuring the current flowing between paired electrodes (), () when a sample is introduced to the reagent layer () of a sensor () and voltage is applied across the electrodes, while also including a processor () for analyzing the sample based on the current after a predetermined reference time point. The analyzer (A) further includes a fail determiner () which monitors the change of the current before and after the reference time point and determines that the sensor () is improper when the current change does not correspond to a predetermined current change.

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Kyoto, Japan

Yoshimitsu Morita