Kabushiki Kaisha Toshiba

Yoshimitsu Itoh

Masanori Kinugasa

Akira Takiba

Masaru Mizuta

Shinji Inada

A protection circuit including a power supply terminal supplied with a power supply potential, a reference terminal supplied with a reference potential, and a first p-channel MOS transistor having a first gate, a first source, a first drain and a first back gate. The first gate, the first source and the first back gate are connected to the power supply terminal. Also included is a second p-channel MOS transistor having a second gate, a second source, a second drain and the first back gate, in which the second source of the second p-channel MOS transistor is connected to the first drain of the first p-channel MOS transistor, and the second gate and the second drain of the second p-channel MOS transistor is connected to the reference terminal. The circuit also includes a first n-channel MOS transistor having a third gate, a third source, a third drain and a second back gate, in which the third gate, in which the third source and the second back gate of the first n-channel MOS transistor are connected to the reference terminal, and including a second n-channel MOS transistor having a fourth gate, a fourth source, a fourth drain and the second back gate, in which the fourth source of the second n-channel MOS transistor are connected to the third drain of the first n-channel MOS transistor, and the fourth gate and the fourth drain of the second n-channel MOS transistor are connected to the power supply terminal.

Protection circuit provided in semiconductor circuit

A temperature detector circuit for converting a forward drop voltage of a diode to digital data by means of an AD converter is provided. In order to restrict an occurrence of an output error caused by dispersion in diode manufacture, correction data according to digital data obtained by the AD converter is stored in advance in a storage circuit under a known arbitrary temperature condition, and subtraction is performed between digital data obtained by the AD converter under an unknown temperature condition and correction data read from a storage circuit, thereby to perform correction.

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Kawasaki, Japan

Yoshimitsu Itoh