Hitachi, Ltd.

Yoshimasa Hamano

Seiji Takeuchi

Yoshinori Takata

Kazunori Fujita

Mamoru Taki

Koichi Uchino

In a method of analyzing a sample by measuring retention time of the components of the sample, a method of ananlysis by chromatogram which displays schematic chromatograms related to particular fillers and particular object components to be analyzed, relying upon the retention time and half widths of various object components to be analyzed that have been stored and are related to various fillers to be charged into the separation column. The invention further deals with a chromatogram analysis apparatus comprising means which stores the retention time and half widths of objects components to be analyzed related to various fillers that are to be charged into the separation column, and means which prepares schematic chromatograms related to particular fillers. Schematic chromatograms are displayed to efficiently and quickly select a filler that is suited for the analysis of saccharide. The apparatus for analysis can be used independently, or as a component of the chromatograph data processor.

Method of chromatogram analysis and an apparatus therefor

A definite, but large amount of a sample solution is fed to a small concentration column filled with a packing material to retain in the concentration column components to be measured in the sample solution. Then, a small amount of a desorbing solution is fed to the concentration column to desorb the components retained in the concentration column. The effluent solution containing the desorbed components is fed to a separation column filled with a packing material. An eluting solution is fed to the separation column to separate the components from one another, and the components are detected by a detector. Since the components are separated from one another after their concentrations have been elevated, and thus the components can be measured with a high sensitivity.

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Katsuta, Japan

Yoshimasa Hamano