Sony Corporation

Sony Group Corporation

Sony Interactive Entertainment Inc.

Sony Corportion

Yoshiki Okamoto

Masaaki Hara

Katsuhiro Seo

Akira Suzuki

Kenji Tanaka

Takashi Kobayashi

Akio Yamakawa

Tomoyuki Umetsu

Kazutatsu Tokuyama

Koji Takasaki

Terumasa Ito

Yoshiaki Kato

Atsushi Fukumoto

Koichiro Kishima

Mamoru Suzuki

Masami Ogata

Masahiko Ito

Masaaki Oka

Takafumi Morifuji

Fumisada Maeda

Satoru Seko

Takeshi Yonezawa

Noriyuki Kato

A microparticle measurement spectrometer includes a spectroscopic element that disperses light emitted from microparticles flowing through a flow path, and a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges and converts optical information obtained by the light receiving elements into electrical information, in which the photoelectric conversion array has a uniform output of all channels when light with which the amount of light per unit wavelength becomes same is incident.

Microparticle measurement spectrometer, microparticle measurement device using the microparticle measurement spectrometer, and method for calibrating microparticle measurement photoelectric conversion system

There is provided an optical measuring device according to an embodiment which includes a spectroscopic optical system that spectrally disperses a fluorescent ray emitted from a specimen that passes through each of a plurality of irradiation spots arrayed in a first direction in a second direction included in a plane parallel to the first direction and an image sensor that receives the fluorescent ray spectrally dispersed by the spectroscopic optical system and generates image data. The second direction is inclined with respect to a plane vertical to the first direction.

Optical measuring device and optical measuring system

To provide a microparticle measurement technology capable of supporting excitation light in a wideband wavelength range. The present technology provides a microparticle measurement device provided with a plurality of objective lenses for excitation light irradiation used for irradiating microparticles flowing through a flow path with excitation light, in which at least one of the objective lenses for excitation light irradiation is used for detecting scattered light emitted from the microparticles by the excitation light with which the microparticles are irradiated through another one of the objective lenses for excitation light irradiation.

Microparticle measurement device, microparticle sorting device, microparticle measurement system, and microparticle sorting system

To provide a technique capable of handling quantitative data in a spectrum type microparticle measurement device without causing deterioration of the SNR. The present technology provides a microparticle measurement spectrometer including a spectroscopic element that disperses light emitted from microparticles flowing through a flow path, and a photoelectric conversion array that has a plurality of light receiving elements having different detection wavelength ranges and converts optical information obtained by the light receiving elements into electrical information, in which the photoelectric conversion array has a uniform output of all channels when light with which the amount of light per unit wavelength becomes same is incident.

There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.

Measurement apparatus configured to control the on/off state of illumination source

[Solving Means] A signal processing apparatus is a signal processing apparatus for an optical tomographic measurement apparatus that generates measurement light and reference light and measures a tomographic structure of a measurement object on the basis of a signal intensity of interference light between the reference light and return light of the measurement light from the measurement object. An arithmetic unit is configured to calculate a signal intensity of simple reflection among the return light of the measurement light, the simple reflection being one time of reflection at a plurality of layers virtually set in a depth direction from a surface layer side of the measurement object. The arithmetic unit is configured to calculate a signal intensity of multiple reflection on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflection being a signal intensity of return light generated by being reflected at the plurality of layers three or more times.

Signal processing apparatus for eliminating object reflection noise in optical tomographic measurement

There is provided a laser scanning microscope apparatus including a first moving part equipped with an objective lens and configured to move the objective lens in a first direction, and a second moving part configured to be movable in a second direction orthogonal to the first moving part and equipped with the first moving part and a reflecting mirror that guides laser light radiated to an observation object and returning light of the observation object in a predetermined direction.

Laser scanning microscope apparatus and control method

An information processing apparatus and method provide logic for processing information. In one implementation, a computer-implemented method includes receiving spatial positions associated with a plurality of images. The method determines displacements of the images in opposing first and second horizontal directions, based on at least the spatial positions. The method then generates, using a processor, first and second composites of the images, based on the determined displacements.

Image processing apparatus and image processing method

In an image processing apparatus, a sensor output data acquisition unit acquires data of layered image information from a sensor group. A slice image generation unit generates data of a two-dimensional image for each slice plane surfaces in which distribution is acquired. An image axis conversion unit generates similar data of a two-dimensional image for a plurality of plane surfaces that are perpendicular to an axis different from a sensor axis. A slice image management unit of a display processing unit manages a slice image that is used for drawing according to the position of a viewpoint or the like. Memory for drawing sequentially stores data of an image necessary for drawing. An additional object image storage unit stores image data of an object that is additionally displayed such as a cursor or the like. An image drawing unit draws a three-dimensional object using data of the slice image.

Image processing apparatus, image processing method and data structure of image file

An optical system for fluorescence detection includes two parabolic mirrors, a first parabolic mirror and a second parabolic mirror, and fluorescent light beams that are incident from different directions are reflected by the first parabolic mirror as parallel light beams to the second parabolic mirror and are converged at one point by the second parabolic mirror.

Optical system for fluorescence detection and fine particle analyzing apparatus

A display apparatus includes a display unit; a barrier unit including a plurality of transmissive sections; and a filter having a transmittance distribution in which transmittance of light passing through a central portion of the transmissive section of the barrier unit is lower than transmittance of light passing through a circumferential portion of the transmissive section of the barrier unit.

Display apparatus

A display apparatus includes: a display unit in which sub-pixels are periodically arranged at a first sub-pixel pitch in a first direction of a screen, each pixel is formed by the plurality of sub-pixels, the pixels are periodically arranged at a first pixel pitch in the first direction, and a plurality of viewpoint images is displayed on a display surface; and a barrier unit in which transmissive sections having a first width in the first direction are periodically arranged. On the assumption that pis the first sub-pixel pitch, pis the first pixel pitch, dis a distance between the display surface of the display unit and the barrier section, and &#x3b1; and m (where m=0, 1, 2, . . . , N&#x2212;1 (where N is the number of plurality of viewpoint images)) are a constant greater than 0, the first width wis expressed by following expression; 

A light irradiation device includes: a focus servo control unit including a light source, a spatial light modulating unit, and a light irradiating unit, for focus servo control so that the ideal focal position of light via an objective lens is such that distance between an ideal focal position and a hologram recording medium surface is smaller than distance from the surface to the lower layer side face of the recording layer, and the focal position of light via the objective lens is constant at the ideal focal position; an objective-lens/relay-lens distance adjusting unit to adjust distance between the objective lens and a relay lens close to the objective lens; a light reception unit to receive marker light; and a constant distance control unit to control the objective-lens/relay-lens distance adjusting unit based on error between the ideal position of the marker light, and the actual position of the marker light.

Light irradiation device for recording information in a hologram recording medium

Disclosed herein is a zoom lens, including: an object side lens group disposed on the object side and including a first variable lens having a deformation surface, the object side lens group having a focal length varied by deformation of the first variable lens; an image side lens group disposed on the image side with respect to the object side lens group with an aperture stop sandwiched therebetween and including a second variable lens having a deformation surface, the image side lens group having a focal length varied by deformation of the second variable lens; and a lens group disposed between the object side lens group and the image side lens group and including the aperture stop. The deformation of the first and second variable lenses is controlled to carry out power variation and carry out image surface movement compensation and focusing by the power variation.

Growing community of inventors

Kanagawa, Japan

Yoshiki Okamoto