Mitsubishi Electric Corporation

Other

Yoshikazu Ikuta

Masashi Nakamura

Yoshinori Ito

Takaya Noguchi

Yuji Ebiike

Daisuke Echizenya

Junichi Yasuda

Teruto Miura

Yoshimi Kinoshita

Koichi Takayama

Akitoshi Miyaoka

Kunifumi Nakanishi

Shuji Nishizaki

A semiconductor test apparatus includes: a power supply; a high-voltage wire connecting high-voltage terminals of a plurality of semiconductor devices which are objects to be tested to a high-voltage side of the power supply; a low-voltage wire connecting low-voltage terminals of the semiconductor devices to a low-voltage side of the power supply; first switches connected in series to the semiconductor devices respectively, each of the first switches having one end connected to the low-voltage side of the power supply via the low-voltage wire and other end connected to the low-voltage terminal; second switches connected to the semiconductor devices respectively, each of the second switches having one end connected to the high-voltage terminal and other end connected to the low-voltage terminal; and a control circuit controlling the first switches and the second switches.

Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method

A solar battery panel wherein cracking of solar battery cells can be reduced without reducing the power generating capacity per unit area. The solar battery panel consists of a plurality of solar battery cells () connected in series by connecting surface electrode tabs () to rear electrode tabs (). In the solar battery panel, a tab-to-tab connecting portion () and a tab-to-cell connecting portion () are arranged via a gap () in the solar battery cell arrangement direction () without these portions overlapping each other. One end portion () of the tab-to-tab connecting portion () exists within a region of a non-light receiving surface ().

Solar battery panel

With the prior art image-adjusting system for a liquid crystal display, flicker is adjusted by operator's visual examination and so human factors vary the potential-adjusting value applied to the common electrode. The invention provides an image-adjusting system and method free of this problem. The image-adjusting method starts with placing optical sensors opposite to a given location on a liquid crystal display. The output waveform from the optical sensors is observed on an oscilloscope in synchronism with the vertical synchronizing signal that is synchronized to odd frames or even frames. The potential applied to the common electrode of the liquid crystal display is shifted upward from the optimum potential to observe a first waveform. The potential on the common electrode is shifted downward from the optimum potential to observe a second waveform. The potential Vcom applied to a liquid crystal display to be adjusted is so adjusted that the waveform derived from the liquid crystal display to be adjusted has a phase midway between the phases of the previously obtained first and second waveforms.

System and method for adjusting image quality of liquid crystal display

Growing community of inventors

Tokyo, Japan

Yoshikazu Ikuta