Screen Holdings Co., Ltd.

International Business Machines Corporation

Kabushiki Kaisha Toshiba

Dainippon Screen Mfg. Co., Ltd.

Yoshikazu Ichioka

Shinichi Kimura

Robert L Wisnieff

Atsushi Ando

Hiroshi Asai

Kouhei Suzuki

Hiroaki Kitahara

Robert J Polastre

Ronald R Troutman

Shinsuke Yamashita

Kazuhiro Nakai

Leslie C Jenkins

Ikuhiko Takahama

Makoto Shiomi

Meiko Ogawa

Shinji Hayashi

Ryouichi Inanami

Hiroshi Ohmichi

Hirobumi Katoh

A shift amount detecting chart is formed on web paper, and the shift amount detecting chart is photographed by an image pickup unit. An image processor calculates shift amounts smaller than a maximum shift amount in absolute values as correction values based on a variation trace of density peak positions from image data corresponding to the shift amount detecting chart photographed by the image pickup unit. A controller corrects printing timing with these correction values. Consequently, even when temporal variations occur to the shift amounts within a predetermined length, since the correction values are calculated based on the shift amounts smaller than the maximum shift amount in absolute values, an excessive correction can be prevented, thereby to improve printing quality.

Printing apparatus and a printing method

There is provided an inspection device, an inkjet printing apparatus, and an inspection method capable of accurately inspecting a printed image printed on a surface of a transparent base material. A first light-emitting unit () emits light from one side of a transparent base material () toward the transparent base material (). An imaging unit () images the transparent base material () from the other side of the transparent base material (). As described, the first light-emitting unit () and the imaging unit () are disposed on the opposite sides of the transparent base material (). As a result, it is possible to suppress generation of the shadow of a printed image itself in a captured image (D). Therefore, the printed image can be accurately inspected based on the captured image (D) obtained.

Inspection device, inkjet printing apparatus, and inspection method

An inspecting apparatus for inspecting print images printed on a transparent printing medium. The apparatus includes a first transport roller for transporting the transparent printing medium; a second transport roller spaced from the first transport roller, and disposed downstream in a transport direction, for transporting the transparent printing medium; a photographing device for photographing the print images located in an inspection area; and a light emitting device for emitting light for photographing the print images located in the inspection area. The first transport roller and second transport roller have outer circumferential surfaces thereof each with a light absorbing member for absorbing the light from the light emitting device.

Inspecting apparatus, and an inkjet printing apparatus having the same

In an image recording apparatus, when an image is recorded on a recording medium, the recording medium passes through a head part only once. Before the image is recorded, a value of a color component of at least some of pixels included in the image is corrected in order to reduce color mixing unevenness. At that time, on the basis of respective values of two reference color components among a plurality of color components of a correction target pixel, a value of one target color component included among the two reference color components is corrected. Alternatively, on the basis of respective values of three reference color components among the plurality of color components, a value of one target color component or respective values of two target color components included among the three reference color components are corrected.

Image recording apparatus, image recording method, and correction information acquisition method

First, shading charts are printed on a surface of a recording medium. Then, a plurality of captured images is acquired for a region of the same density of the shading charts printed on the recording medium. At this time, the amounts of displacement in the position of the recording medium in the main scanning direction, which is the direction of arrangement of nozzles, are also detected. Then, one super-resolution image with a higher resolution than the captured images is generated on the basis of the captured images and the amounts of displacement in the position of the recording medium in the main scanning direction. Thereafter, a variable-density correction amount is calculated for each of the nozzles on the basis of the generated super-resolution image.

Inkjet printing apparatus and variable-density correction method

An image obtained by shrinking an original image in a row direction is halftoned, and this halftone dot image is enlarged in the row direction and recorded at double speed. In order to determine a threshold value of a threshold matrix used for halftoning an image, prepared is a matrix space in accordance with writing positions used for actual recording of an image. In the matrix space, writing elements are set alternately with non-writing elements both in the row direction and in a column direction. In the matrix space, turn-on numbers are allocated to all the writing elements in avoidance of the non-writing elements. Then, in accordance with the turn-on numbers, respective threshold values for the writing elements are determined. By shrinking the threshold matrix in the row direction with omission of the non-writing elements, a threshold matrix for double speed is obtained.

Generating a threshold matrix to be compared with an original image for performing halftoning of the original image

A method for creating charged-particle-beam exposure data containing a description of an exposure sequence of character patterns to perform exposure of a charged-particle-beam according to a character projection technique, comprising selecting first or second values as a parameter to transfer one character pattern and then transferring a subsequent character pattern, the first value regarding performance of a shaping deflector which deflects the charged particle beam so that the charged particle beam is applied to an arbitrarily character aperture formed in a CP aperture mask and a character beam having the shape of the character aperture is thereby created, and the second value regarding performance of an objective deflector which deflects the character beam so that the character beam is applied to an arbitrarily position of the deflection region of the specimen, and determining the exposure sequence of the character patterns in the deflection region in accordance with the selected parameter.

Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program

An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines. Devices are provided for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines. Devices are also provided for acquiring waveforms from data lines of the array. Additional devices sample the waveforms at selected points in time. A computer may be used to classify the waveforms to indicate whether defects are present and if present, the nature of the defects by comparing voltages of the waveform at the selected points in time.

Array tester for determining contact quality and line integrity in a

The invention relates to a printing apparatus in which at least two printing elements are arranged a predetermined distance apart in a line parallel to the print direction. When two dots to be printed are the same predetermined distance apart as the print elements, only one of those print elements is used to print those dots.

Print element assignment in printing apparatus

An active matrix type liquid crystal display device with a short-circuiting wire for mutually short-circuiting address wires and data wires through the medium of resistors made of a thin-film transistor is formed along the periphery of a display region on an insulating substrate. The short-circuiting wire is electrically connected inside a region in which the resistors made of a thin-film transistor are formed. In one embodiment, the transistors are surrounded by a portion of the shod circuiting wire. In another embodiment, they are partially surrounded by the wire with a gate electrode which is not protruding out. In another embodiment they are formed with two source and drain regions, one which has a lower breakdown voltage than the other.

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Kyoto, Japan

Yoshikazu Ichioka