Kabushiki Kaisha Toshiba

Yoshikatu Hatagaki

Hidekazu Saito

Eiji Hasegawa

Masaki Kume

Ayumi Ishii

There are provided a semiconductor device and a function module test method, capable of reducing the test time of function modules and reducing the number of test pins. This semiconductor device is formed so as to make test inputs and test outputs of a plurality of function modules having the same function respectively common, conduct tests on arbitrarily selected function modules simultaneously in parallel, and give a pass/fail decision on the semiconductor device including the function modules on the basis of results of comparison between a test result of arbitrary one function module and test results of other function modules.

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Kanagawa-ken, Japan

Yoshikatu Hatagaki