Jasco Corporation

Hitachi Systems, Ltd.

Other

National Institute of Advanced Industrial Science and Technology

Yoshihito Narita

Tsutomu Inoue

Fuminori Sato

Kentarou Oonishi

Katsuro Kikuchi

Takayuki Fujiwara

Shintaro Tsuchiya

Shigeyuki Kimura

Motoichi Ohtsu

Minoru Kaneko

Susumu Teruyama

Masato Nakamura

Kazuki Watanabe

Atsushi Suzuki

Osamu Saito

Hironori Wakana

Shinichiro Watanabe

Shinya Saito

Toru Kono

Hiroshi Hayakawa

Takashi Fukuda

Yu Zhao

Shuji Mononobe

Tatsuya Miyajima

Daisuke Katsumata

Toshiharu Saiki

Mutsumi Senuma

Atsushi Yamada

Jun-ichiro Watanabe

Tadanori Koike

Ryouichi Ueda

Tohru Sakamaki

Norihito Hujiwara

Hideho Hisada

Koji Akutsu

Keiichi Nagashima

Akira Emoto

A reflective polarized-light separating diffraction-element including a substrate, a reflection surface formed on a surface of the substrate, and a lattice structured body assembly that is provided on the reflection surface and exhibits a form birefringence (Δn*). The lattice structured body assembly includes lattice structured bodies of a plurality of patterns having lattice structures of different azimuths, and these lattice structured bodies of a plurality of patterns are aligned in a predetermined direction on the reflection surface so that the azimuths of the lattice structures change in a structurally periodic manner.

Reflective polarized light separation and diffraction element and optical measurement device comprising same

The content creation system comprises: an operation measurement devicethat acquires, as measurement information, a three-dimensional work operation of a model worker Rthat performs the work of the work procedure; an evaluation criterion creation devicethat creates evaluation criterion information on the work of the work procedure, based on the measurement information of the three-dimensional work operation; and a content creation devicethat creates and updates the training content, based on the measurement information of the three-dimensional work operation, the evaluation criterion information and the three-dimensional shape information of the work target device. The work management servercreates the evaluation criterion information, based on distance information of the three-dimensional work operation with respect to the three-dimensional shape in specific stage of the work procedure, on the condition that a predetermined body motion of the model worker Ris detected.

Content creation system

A content presentation system includes: a trainee terminal that presents training content to the trainee; a worker terminal used by a worker; a tool recognition device that acquires a work video of the worker and recognizes the tool being used by the worker; a determination device that determines success or failure of the work at a specific stage based on the information about the work tool recognized by the tool recognition device; and a content creation device that creates and updates the training content based on the determination result of the determination device. When the determination result is determined to be the failure of the work by the determination device, the content creation device identifies a portion of the training content corresponding to the specific stage in the work procedure and updates the portion of the training content so as to suppress a factor of the failure.

Content presentation system and content presentation method

A content presentation system includes: a training content distribution functionthat presents the training content to the trainee; a work content delivery functionthat presents a work procedure based on augmented reality; a user operation detection unitthat detects a three-dimensional operation of the site worker; a work record analysis functionthat determines success or failure of the work based on the evaluation reference information; and a content creation/updating functionthat updates the training content based on the determination result. When a predetermined body motion of the worker is detected, the work record analysis function determines whether the work has failed based on the measurement information of the model worker up to the body motion. When the work is determined to have failed, the content creation/updating function updates the training content so as to suppress the factor of the failure.

The present invention relates to an aircraft-utilizing deterioration diagnostic system and provides a technique capable of improving diagnostic efficiency and accuracy when comparing the previous and current aerially-photographed images to diagnose a deteriorated state of a target. The diagnostic system includes: a drone(aircraft) configured to be navigated along a route around a targetand having a cameraconfigured to photograph the target; and a computer (PCand server) configured to control navigation of the aircraft and photographing by the camera. The computer is configured to: acquire data from the aircraft including an image group obtained by consecutively photographing the targetfor each predetermined date and time; based on diagnostic data including a diagnostic image group photographed at a current date and time, reference data including a reference image group of a previous date and time, associate, for the same target, images including the same portion as comparison target images; compare the previous image and the current image among the comparison target images to detect a deteriorate portion; and provide a screen converted and visualized for the user such that the deteriorated portion in the image is plotted on the three-dimensional model of the target.

Aircraft-utilizing deterioration diagnosis system

A defective photovoltaic cell module is identified without disconnection in a photovoltaic cell string. As a typical embodiment, in a photovoltaic power generation inspection system in a photovoltaic power generation system having a structure in which a plurality of photovoltaic cell strings are connected in parallel, the photovoltaic power generation system detecting a defective module among a plurality of modules included in a defective string, the photovoltaic power generation inspection system includes: a current detector that measures an output current of a photovoltaic cell string without disconnection; and a monitor unit that estimates a defective module based on change in a plurality of output currents each measured by the current detector while the photovoltaic cell modules included in the defective string are sequentially shielded from light by a light shielding member.

Solar power generation examination system and solar power generation examination method

A photovoltaic inspection system is provided, the photovoltaic inspection system detecting a failure by eliminating ON/OFF operation of a switch or others at the time of inspection or checkup as much as possible, reducing an influence of a temperature distribution as a whole with a small effort, and detecting a local deterioration in a photovoltaic module or string. According to a typical embodiment, in a photovoltaic system having a plurality of photovoltaic strings formed of one or a plurality of photovoltaic modules arranged to be aligned, a photovoltaic inspection system which detects the failure in the photovoltaic strings includes: a current detector which measures each of a first output current of a first photovoltaic string and a second output current of a second photovoltaic string; and a monitoring unit which calculates a second temperature property of the second photovoltaic string based on a value of the first output current and a value of the second output current and which determines whether the second photovoltaic string has the failure or not based on the second temperature property.

Photovoltaic inspection system and photovoltaic inspection method

A near-field polarized-light measurement apparatuscomprises a near-field probe, an analyzer, a detector, and an analyzer-rotating unit. The near-field probehas at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detectordetects light transmitted through the sample via the analyzer. The analyzer-rotating unitrotates the analyzerabout an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzerwith the analyzer-rotating unit

Near-field polarized-light measurement apparatus

A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light

It is an object of the present invention to provide a probe that may correspond to various styles of measurement when used in microscopes and that is also applicable to recording devices and an optical head using the same, as well as to provide a method for manufacturing such a probe in a simple and costless manner; for achieving such objects, the method for manufacturing a multiple optical path array type probe according to the present invention is arranged in that in a light guiding material including a substrate that functions as a clad and a light guiding path formed of a component that functions as a core for guiding light or as a waveguide, the light guiding material includes a plurality of light guiding paths aligned to be parallel to each other within the substrate that functions as a clad, and tip end portions of the light guiding paths are sharpened through chemical etching of an end surface that is orthogonal to the plurality of light guiding paths.

Fiber, probe and optical head of multiple optical path array type and methods for manufacturing the same

An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source ; reflection means , light detection means ; press means pressing a probe tip against said reflection means; storage means ; calculation means figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

Probe opening fabricating apparatus, and near-field optical microscope using the same

An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source ; reflection means ; light detection means ; press means pressing a probe tip against said reflection means; storage means ; calculation means figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

The near-field spectrometer comprises a Z-axis scanner for bringing a sample and the tip of a probe close to each other at a predetermined distance within a near-field region when obtaining near-field spectral information and separating them from each other at a predetermined distance outside a near-field region when obtaining back ground spectral information, and a data processor for obtaining the true near-field spectral information free from the background by subtracting the background spectral information from the near-field spectral information, characterized in that a background information collector, during the separation of the sample and the tip of the probe at a predetermined distance outside the near-field region, obtains the background spectral information for the corresponding portion to be measured.

Near-field spectrometer having background spectral information

A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity.

Growing community of inventors

Tokyo, Japan

Yoshihito Narita