Panasonic Corporation

Yoshihisa Tanaka

Kozo Nishimura

Hideyuki Kanzaki

A system performance profiling device is provided inside a system-on-chip (SoC). Selectors respectively select values of predetermined bit positions of counters and output the selected values to the outside of the system-on-chip, during a period of acquisition of profiling data. When the acquisition of the profiling data ends, the selectors respectively select values of all lower bit positions of the counters than the predetermined bit positions, and output the selected values to the outside of the system-on-chip.

Growing community of inventors

Shiga, Japan

Yoshihisa Tanaka