Konica Minolta Sensing, Inc.

Konica Minolta, Inc.

Toyo Tanso Co., Ltd.

Minolta Company, Ltd.

Konica-minolta Holdings, Inc.

Yoshihisa Abe

Shinichi Horita

Wataru Yamaguchi

Koji Harada

Yosuke Takebe

Masanari Watanabe

Takayuki Mukai

Koji Yamamoto

Osamu Toyama

Satoshi Yokota

Satoru Nogami

Shinji Yamamoto

Hironori Sumitomo

Takafumi Komatsu

Yoshitaka Teraoka

Toshio Kawano

Yuta Yamanoi

Masato Shinohara

Tadashi Fukumoto

Shinichi Iida

Hitoshi Kamezawa

Norimasa Kubota

Hirokazu Fujiwara

Masaaki Chigasaki

Koji Morimoto

Masahiro Ariizumi

Hiroki Aomatsu

Osamu Tamura

Norimasa Yamada

Akira Kubo

Shigeru Osaki

Norio Matsunaga

Colorimeter having first and second illumination units disposed symmetrically to a reference line in a prescribed plane, first and second light-receiving parts disposed symmetrically to the reference line in the prescribed plane, a calculation unit for determining color information about a measurement object, and an opposing wall that opposes the measurement object when it is measured. The opposing wall has an abutting part that abuts the measurement object when it is measured. The abutting part has a pair of first abutting parts disposed on two sides of a measurement opening to flank the measurement opening; and a pair of second abutting parts disposed on an orthogonal line orthogonal to a first-abutting-part connection line that connects the pair of first abutting parts to each other, the pair of second abutting parts being disposed on two sides of the first-abutting-part connection line to flank the first-abutting-part connection line.

Colorimeter capable of taking a fixed posture with respect to a measurement object

An optical measuring device comprises: a lens to form an image with reflected light from a measuring object; an image sensor to receive the reflected light that has passed through the lens and generate an image representing the measuring object; a driver to drive a drive object, the drive object being at least one of the lens and the image sensor; and a controller to control the optical measuring device. The controller acquires, from the image sensor, a plurality of images generated by the image sensor successively imaging the measuring object while the driver is driving the drive object in accordance with a predetermined driving pattern, and outputs the plurality of images.

Optical measuring device, image generating method, and image generating program

Provided are a susceptor that, in forming a thin film on a wafer, can reduce impurities or the like adhering to the wafer and a method for manufacturing the same. A susceptor includes a base material () with a recess (), a tantalum carbide layer () formed directly on a bottom surface () and a side surface () of the recess (), and a silicon carbide layer () formed on a surface of the base material () except for the recess ().

Susceptor and method for manufacturing same

Since both gloss and a reflection characteristic are measured by one surface characteristic measurement device, a gloss measurement target area and a reflection characteristic measurement target area are appropriately set. A gloss measurement instrument and a color measurement instrument are integrated with a gloss colorimeter. The gloss measurement instrument illuminates an illumination target face by illumination light, receives reflected light generated by a regular reflection of the illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the gloss measurement target area can be changed. The color measurement instrument illuminates the illumination target face by annular illumination light, receives reflected light generated by a reflection of the annular illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the reflection characteristic measurement target area can be changed.

Surface characteristic measurement device

A surface inspection device includes an opening defining an aperture plane, one or more optical transceivers, and a processor. Each optical transceiver includes a light emitter and a light receiver that are arranged in different directions with respect to the aperture plane when viewed from above a virtual normal line of the aperture plane. The processor acquires detection values from the optical transceivers and calculates an evaluation value of a degree of variation in the detection values.

Surface inspection device, surface inspection method, and program

Provided is a method for carburizing a tantalum container which can easily control the carburization thicknesses of various portions of the tantalum container and carburize the tantalum container with a uniform thickness. A method for carburizing a tantalum containermade of tantalum or a tantalum alloy to allow carbon to penetrate the tantalum containerincludes the steps of: supporting the tantalum containeron a support memberprovided in a chamberand setting the tantalum containerin the chamber; and reducing the pressure inside the chamberand heating the interior of the chamber, wherein a carbon source is placed in the vicinity of a portion of the tantalum containerhard to carburize.

Method for carburizing tantalum container

Provided is a method for carburizing a tantalum member whereby the tantalum member is less deformed by carburization and can be carburized with good flatness of the planar part thereof and in a uniform manner. The method is a method for subjecting a tantalum membermade of tantalum or a tantalum alloy and having a planar partto a carburization process for allowing carbon to penetrate the memberfrom the surface toward the inner portion thereof and includes the steps of: setting the tantalum memberin a chambercontaining a carbon source by supporting the planar parton a plurality of support rodstapered at distal endsthereof; and subjecting the tantalum memberto a carburization process by reducing in pressure and heating the interior of the chamberto allow carbon derived from the carbon source to penetrate the tantalum memberfrom the surface thereof.

Method for carburizing tantalum member, and tantalum member

A technique is provided which can improve the precision of a matching point search with a plurality of images taking the same object where distant and near views coexist. A plurality of first images obtained by time-sequentially imaging an object from a first viewpoint, and a plurality of second images obtained by time-sequentially imaging the object from a second viewpoint, are obtained. Reference regions including a reference point are set respectively in the first images with the same arrangement, and comparison regions corresponding to the form of the reference regions are set respectively in the second images with the same arrangement. One reference distribution of pixel values about two-or-more-dimensional space is generated from the distributions of pixel values about the plurality of reference regions, and one comparison distribution of pixel values about two-or-more-dimensional space is generated from the distributions of pixel values about the plurality of comparison regions. Then, a matching point in the plurality of second images that corresponds to the reference point is detected by using the reference distribution of pixel values and the comparison distribution of pixel values.

Image processing apparatus, information processing system, and image processing method

This invention provides a tantalum carbide-coated carbon material, which has excellent corrosion resistance to reducing gases and thermal shock resistance at high temperatures, and a process for producing the same. The tantalum carbide-coated carbon material comprises a carbon substrate and a coating film provided on the carbon substrate directly or through an intermediate layer. The coating film is formed of a large number of densely aggregated fine crystals of tantalum carbide. The diffraction line of the (220) plane of tantalum carbide shows the maximum diffraction intensity in an X-ray diffraction pattern of the coating film. More preferably, this diffraction intensity is not less than four times the intensity of a diffraction line showing the second highest diffraction intensity.

Tantalum carbide-coated carbon material and production method thereof

A method is provided for controlling display of three-dimensional data in a three-dimensional processor that processes three-dimensional data indicating three-dimensional position coordinates of each point on a surface of an object to be measured, the three-dimensional data being obtained by projecting measurement light onto the object and receiving measurement light reflected from the object. The method includes obtaining reliability data that are an index of reliability of three-dimensional data of said each point, enabling a user to adjust a threshold for defining a range of the reliability, and displaying, on a screen of a display, three-dimensional data corresponding to reliability falling within a range defined by the threshold adjusted by the user with the three-dimensional data displayed distinguishably from different three-dimensional data.

Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor

A three-dimensional shape measuring apparatus includes a measuring section and a data integrating section. The measuring section has three-dimensional measurement dimensions, and measures a three-dimensional shape of a measurement object in a non-contact state. The measuring section measures a three-dimensional shape of a part of the measurement object multiple times by shifting the measurement dimensions to obtain multiple measurement data. The measurement dimensions are shifted in such a manner that at least portions of consecutive measurement dimensions by the shifting are lapped one over the other. The data integrating section integrates the multiple measurement data to obtain the three-dimensional shape of the measurement object. The data integrating section executes the data integration, using reliability information attributed to the respective measurement data.

Three-dimensional shape measuring apparatus

A method and system are provided which can easily determine relative positions and postures of a three-dimensional measurement device and an object when the measurement device is used to measure the object using a manipulator. The method includes fixing one of the measurement device and the object, supporting the other at a support point with the manipulator so that a position and support posture of the other can be changed, conducting first measurement with the support point being set to first position and posture, changing the support point to second position and posture so that the second position is a position where the posture is changed, about a reference position within a measurable area of the measurement device in the first measurement, to an opposite side by a degree equal to a portion corresponding to a change from the first posture to the second posture, and conducting second measurement.

Method and system for three-dimensional measurement and method and device for controlling manipulator

A three-dimensional measurement method is provided for measuring an object shape in a non-contact manner by using a non-contact sensor and a sensor moving mechanism that changes a position and a posture of the sensor and can operate by numerical control, moving the non-contact sensor in accordance with measurement path information indicating plural positions and postures of the sensor at the respective positions. The measurement path information is set in advance by teaching. The method includes performing preliminary three-dimensional measurement of the object in accordance with preliminary measurement path information, using shape data obtained by the preliminary three-dimensional measurement and shape data of an imaginary object as a measurement target in the teaching to detect positioning error between the object and the imaginary object, modifying the measurement path information depending on the detected positioning error, and performing three-dimensional measurement of the object in accordance with the modified measurement path information.

Method and system for three-dimensional measurement

A three-dimensional shape measuring system is provided with a measuring unit having a three-dimensional measurement range and adapted to measure the three-dimensional shape of a measurement object in a noncontact manner, a measurement range shifting unit for shifting the position of the measurement range of the measuring unit, a shape calculating unit for calculating the overall three-dimensional shape of the measurement object from a plurality of measurement data obtained by shifting the measurement range relative to the measurement object, and a judging unit for setting judgment areas in specified peripheral areas within the measurement range and judging the presence or absence of any unmeasured area of the measurement object outside the measurement range based on measurement data corresponding to the judgment areas. The measurement range shifting unit shifts the position of the measurement range in a direction toward the unmeasured area when the presence of the unmeasured area is judged by the judging unit.

Three-dimensional shape measuring system

In a method for aligning three-dimensional shape data obtained by performing a three-dimensional measurement of an object, photogrammetry of the object with a target mark is performed to obtain a three-dimensional position and a normal vector of the target mark by a calculation, and the three-dimensional measurement of the object is performed to obtain a three-dimensional position and a normal vector of the target mark. Then, determined is a correspondence between the three-dimensional position of the target mark obtained by the photogrammetry and the three-dimensional position of the target mark obtained by the three-dimensional measurement, by using the three-dimensional position and the normal vector of the target mark obtained by the photogrammetry and those of the target mark obtained by the three-dimensional measurement, and three-dimensional shape data obtained by the three-dimensional measurement is aligned based on the correspondence between the three-dimensional-positions of the target marks.

Method and system for aligning three-dimensional shape data from photogrammetry data and three-dimensional measurement data using target locations and surface vectors

Growing community of inventors

Sakai, Japan

Yoshihisa Abe