Axelspace Corporation

Mitsubishi Electric Corporation

Hitachi-high-technologies Corporation

Hitachi High-tech Corporation

Yoshihiro Ota

Yasutaka Toyoda

Hiroyuki Shindo

Hiromi Fujita

Tomooki Ukiana

Takuya Furuhashi

Shinyoung Park

Naoki Miyashita

Emiko Kido

Toshikazu Kawahara

Natsumi Tamura

Shigeki Sukegawa

Mari Orito

Ryota Kaneko

James Alexander Hamilton

Taiki Oyama

An information processing apparatus, comprising: one or more processing devices; and one or more storage devices storing instructions for causing the one or more processing devices to: acquire observation information obtained through observation of a target region from a flying object flying in outer space; classify the target object by inputting the observation information acquired to a classifier so trained as to output a classification result obtained by classifying a target object present in the target region if the observation information is input; accept designation input for designating the target object; and output the observation information including a classification result of the target object designated.

Information processing apparatus, information processing method and non-transitory computer-readable storage medium

An information processing apparatus comprising: one or more processing devices; and one or more storage devices storing instructions for causing the one or more processing devices to: store observation information obtained through observation of a target region on the earth from a flying object moving in outer space into the one or more storage devices; output to a terminal device a map image corresponding to the target region on which a dividing line for dividing the target region into a plurality of areas is superimposed; accept designation input for designating multiple ones of the plurality of areas divided by the dividing line from the terminal device; extract area observation information being a part of the observation information and corresponding to each of the multiple ones of the plurality of areas designated; and output to the terminal device the area observation information extracted.

In an operation control device (), a plan selection unit () determines, at a time point midway through a time zone where an operation of an air conditioner () is controlled along one control plan among a plurality of control plans, whether a weather change pattern corresponding to the one control plan deviates from an actual weather change pattern, based on weather data. If deviates, the plan selection unit () selects a weather change pattern that is different from the weather change pattern corresponding to the one control plan, from among a plurality of weather change patterns, in accordance with the weather data. During a rest of the time zone, the plan selection unit () controls the operation of the air conditioner () along a control plan corresponding to the different weather change pattern, among the plurality of control plans.

Operation device and method to control an air conditioner based on weather change patterns

The purpose of the present invention is to provide a recipe creation device, with the goal of using past recipe data in order to highly efficiently create recipes. As an embodiment with which to achieve this goal, there is provided a recipe creation device comprising an arithmetic processing device that, on the basis of design data for a semiconductor element, establishes measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device, wherein the arithmetic processing device is configured to be able to access a database in which the measurement conditions or inspection conditions, and the pattern information of the semiconductor element, are stored in associated form, and the measurement conditions or inspection conditions are selected through a search using pattern information of the semiconductor element.

Recipe creation device for use in semiconductor measurement device or semiconductor inspection device

An object of the invention is to provide a pattern measuring device for generating appropriate reference pattern data while suppressing an increase in the manufacturing cost that would occur when manufacturing conditions are finely changed. A pattern measuring device has an arithmetic processing unit for measuring a pattern formed on a sample. The arithmetic processing unit, on the basis of signals obtained with a charged particle beam device, acquires or generates image data or contour line data on a plurality of circuit patterns created under different manufacturing conditions of a manufacturing apparatus, and generates reference data to be used for measurement of a circuit pattern from the image data or contour line data.

Pattern sensing device and semiconductor sensing system

Growing community of inventors

Tokyo, Japan

Yoshihiro Ota