Konica Minolta, Inc.

Minolta Company, Ltd.

Konica Minolta Sensing, Inc.

Konica Minolta Optics, Inc.

Yoshihiro Nishikawa

Tsutomu Okura

A flicker measuring device of the present invention: receives light emitted from an object to be measured and outputs a light reception signal corresponding to an amount of received light; acquires the output light reception signal a plurality of times from a measurement start time point to a steady time point at which the object to be measured is in a steady state, obtains a flicker value of the object to be measured for each of the plurality of times on the basis of the acquired light reception signal, and stores the flicker value obtained for each of the plurality of times in a storage in association with an acquisition time point of the light reception signal; and performs an arithmetic processing of obtaining a flicker shift time by using each flicker value stored, in which in the arithmetic processing, an amount of overall change is obtained that is an amount of change of the flicker value from the initial flicker value to the steady flicker value, a predetermined ratio time point is obtained at which an amount of change of the flicker value from the reference flicker value is a predetermined ratio of the amount of overall change, and an elapsed time between the predetermined ratio time point and the reference time point is obtained as the flicker shift time.

Flicker measuring device, flicker measuring method, and flicker measuring program

A residual DC measurement device of the present invention receives light emitted from a display device and outputs a light reception signal, measures a flicker value of the display device on the basis of the light reception signal output while the flicker measurement image is displayed by the display device and stores the flicker value in a storage as an initial flicker value, subsequently causes the display device to display a predetermined display image for a predetermined display time, causes the display device to display the flicker measurement image again when the predetermined display time elapses, measures the flicker value of the display device on the basis of the light reception signal output while the flicker measurement image is displayed and stores the flicker value in the storage as a posterior flicker value, and calculates a flicker change amount by calculating the posterior flicker value stored in the storage and the initial flicker value as an index value representing the residual DC.

Residual DC measurement device, residual DC measurement method, and residual DC measurement program

A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a photometric quantity obtained by performing photometry in the measurement target at a first sampling frequency; a second calculation unit that calculates a flicker amount of a predetermined measurement region set on the measurement target based on a photometric quantity obtained by performing photometry in the predetermined measurement region at a second sampling frequency; and a correction unit that corrects the flicker amount of each of the plurality of measurement regions calculated by the first calculation unit using a correction coefficient defined by the flicker amount calculated by the second calculation unit and a flicker amount of the predetermined measurement region calculated based on a photometric quantity obtained by performing photometry in the predetermined measurement region at the first sampling frequency.

Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method

The provided solar simulator light-intensity evaluation apparatus and method can evaluate the characteristics of a solar cell in an arbitrary place at an arbitrary time and date, using an existing solar simulator, as follows: an estimated spectral irradiance of the natural sunlight is calculated under a measurement condition including a place and/or a time and date where and when the solar cell is measured; and an target value of adjustment and estimated light amount value of the solar simulator are calculated under the measurement condition, on the basis of the estimated spectral irradiance having been calculated, the spectral irradiance of the solar simulator, and solar cell information including a spectral sensitivity of the solar cell.

Solar simulator light-amount evaluation apparatus, solar simulator light-amount evaluation method, solar cell evaluation apparatus, and solar cell evaluation method

In a solar cell evaluation device, a spectral sensitivity P(&#x3bb;) of a solar cell, which is a measurement object, is measured in advance. When the solar cellis evaluated, a spectral irradiance L (&#x3bb;) of illumination light is measured, generated power EL of the solar cellthat is generated with the illumination light is measured, and the measured generated power EL of the solar cellis converted into generated power ES generated by the solar cellin the case of illumination with illumination light with a spectral irradiance S(&#x3bb;) based on the reference solar light. Therefore, since the calibration in the solar cell evaluation deviceis performed with software, the calibration can be performed in a simple manner and at a low cost even when the solar cell type is changed.

Solar cell evaluation device and solar cell evaluation method

With a light source evaluation deviceaccording to the present invention and a solar cell evaluation deviceemploying the same, a dependency P (&#x3bb;, Ib) for each wavelength &#x3bb; of a short-circuit current Ib generated by white bias light of a measurement target solar cell, which is pre-measured at each of a plurality (i) of irradiance levels, is regarded as a spectral responsivity Pi (&#x3bb;) at each irradiance level, and a value for adjusting a light quantity of an illumination light sourcethat illuminates the solar cellis computed using a spectral responsivity Ps (&#x3bb;), which is computed using the spectral responsivity Pi (&#x3bb;), a pre-supplied spectral irradiance S (&#x3bb;) of reference sunlight, and a pre-measured spectral irradiance L (&#x3bb;) of the illumination light source. Therefore the light source evaluation devicehaving this configuration and the solar cell evaluation deviceemploying the same can accurately adjust the light quantity of the illumination light sourcewhen evaluating the solar cellof which spectral responsivity changes depending on the light quantity.

Light source evaluation device and solar cell evaluation device

An apparatus for measuring a profile of an electron beam of a CRT includes a test pattern generator which generates a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, and an image pickup device which picks up the plurality of separate luminous images in a single pickup operation. Positions of phosphors defining one luminous image are made to be relatively different from those of phosphors defining another luminous image. The apparatus is provided with a relative position calculator for calculating respective relative positions of phosphors defining each luminous image, and a beam profile calculator for calculating a profile of an electron beam of the CRT based on outputted pixel data and calculated relative positions.

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Kobe, Japan

Yoshihiro Nishikawa