Hitachi-high-technologies Corporation

Hitachi High-tech Corporation

Yoshihiro Naitou

Hirofumi Sasaki

Toshihide Hanawa

Tsuguhiko Satou

Disclosed is an automatic analysis device in which a check item at a time of an analysis start can be set in accordance with a skill level of an operator, an analysis can be performed after the check item being displayed and confirmed, and erroneous measurement caused due to a missed check can be prevented. The check item such as checking the remaining quantity of a reagent or the like displayed in a check screen before the analysis start can be set for each type of operator, each day, each time. The set check item is configured to be displayed in a screen before the analysis start, and unless the operator confirms the check item, the analysis start is not allowed in principle. An automatic analysis device which can prevent erroneous measurement caused due to a missed check of the operator before the analysis start is realized.

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Tokyo, Japan

Yoshihiro Naitou