Hamamatsu-Photonics K.k.

Yoshihiro Maruyama

Katsumi Shibayama

Masashi Ito

Kazuto Ofuji

Hiroki Oyama

Mitsuhiro Ito

Masaki Hirose

Toshiyuki Nagata

Hisashi Takamori

Takafumi Yokino

Anna Yoshida

Toru Hirohata

Hiroki Kamei

Takashi Kasahara

Toshimitsu Kawai

Kazuhiko Fujiwara

Noriyasu Ito

Nao Inoue

Masashi Fukuhara

Masahi Ito

A spectrum analysis apparatus is an apparatus for analyzing an analysis object on the basis of a spectrum of light generated in the analysis object containing any one or two or more of a plurality of reference objects, and includes an array conversion unit, a processing unit, a learning unit, and an analysis unit. The array conversion unit generates two-dimensional array data on the basis of a spectrum of light generated in the reference object or the analysis object. The processing unit includes a deep neural network. The analysis unit causes the array conversion unit to generate the two-dimensional array data on the basis of the spectrum of light generated in the analysis object, inputs the two-dimensional array data to the deep neural network, and analyzes the analysis object on the basis of data output from the deep neural network.

Spectral analysis apparatus and spectral analysis method

A concentration measurement method is a method for measuring a concentration of an analyte in a measurement solution containing the analyte having reducing action, and includes a mixing step of preparing a mixture solution by mixing a metal ion solution, a complexing agent, and a pH adjusting agent to prepare an intermediate mixture solution, and mixing the intermediate mixture solution and the measurement solution, a metal microstructure generation step of generating a metal microstructure on a support by reducing metal ions in the mixture solution by the reducing action of the analyte in the mixture solution, a measurement step of measuring an optical response of the metal microstructure on the support, and an analysis step of determining a concentration of the analyte in the measurement solution on the basis of a measurement result of the optical response.

Concentration measurement method

Substrate for spectroscopic analysis

An SERS unit includes a supportthat includes a cavityprovided with an opening, an optical functional portionthat is disposed in the cavityto face the openingand causes surface enhanced Raman scattering, and a packagethat accommodates the supportand is evacuated. The packageis in contact with at least an edgeof the opening, and is bent toward the optical functional portionin a state in which the packageis spaced apart from the optical functional portionin the opening

Surface-enhanced Raman scattering unit

A SERS unit comprises an integrally formed handling board and a SERS element secured within a container space provided in the handling board so as to open to one side in a thickness direction of the handling board. The SERS element has a substrate arranged on an inner surface of the container space and an optical function part formed on the substrate, for generating surface-enhanced Raman scattering.

Surface-enhanced Raman scattering unit including integrally formed handling board

A surface-enhanced Raman scattering element comprises a substrate having a principal surface; a molded layer having a support part formed on the principal surface of the substrate so as to extend along the principal surface and a fine structure part formed on the support part; a frame part formed on the principal surface of the substrate so as to surround the support part and fine structure part along the principal surface; and a conductor layer formed on at least the fine structure part and constituting an optical functional part for generating surface-enhanced Raman scattering; while the fine structure part are formed integrally with the support part.

Surface-enhanced Raman scattering element

An SERS element includes a substrate, a fine structure portion formed on a surface of the substrate and having a plurality of pillars, and a conductor layer formed on the fine structure portion and constituting an optical functional portion that causes surface-enhanced Raman scattering. A groove is provided in an outer surface of each pillar. A plurality of gaps are formed in the conductor layer by forming the conductor layer on the outer surface of each pillar in a state in which at least a portion of an inner surface of the groove is exposed.

Surface-enhanced raman scattering element and method for manufacturing same

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Hamamatsu, Japan

Yoshihiro Maruyama