Ricoh Company, Ltd.

Yoshihiko Miki

Kazuhiro Yoneda

Naoki Fukuoka

Hirofumi Watanabe

Takaaki Negoro

Katsuyuki Sakurano

Toshiyuki Ikeoh

Keiji Tsuda

Kazuki Nagasawa

A measuring apparatus includes an irradiation device configured to irradiate an object with light; an imaging device configured to capture an image of the object irradiated with the light and generate captured image data; and circuitry. The circuitry is configured to measure the object based on the captured image data generated by the imaging device; and adjust, with a moving mechanism, relative positions among the object, the irradiation device, and the imaging device in response to a determination that the captured image data includes a region satisfying a predetermined condition.

Measuring apparatus, movable apparatus, robot, electronic device, fabricating apparatus, and measuring method

An optical device according to an embodiment of the present disclosure includes a light source in which a plurality of light emitting elements are arranged at a predetermined distance, an optical system configured to convert light beams from the plurality of light emitting elements into line light beams, and a light deflection element configured to deflect each of the line light beams. Each of the line light beams is caused to be incident on the light deflection element such that a longitudinal direction of each of the light beams is aligned with a direction of a rotating axis of the light deflection element.

Optical device, measurement device, robot, electronic apparatus, mobile object, and shaping device

According to one embodiment, a light source includes a plurality of light-emitting elements each including one or more surface-emitting lasers; and a plurality of detecting elements located on a same substrate as the light-emitting elements. The detecting elements individually detect quantities of output light of the light-emitting elements.

Light source, optical device, measuring device, robot, electronic apparatus, movable structure, and manufacturing apparatus

A plurality of surface emitting lasers are formed on the single surface emitting laser element. The plurality of surface emitting lasers have respective emission wavelengths selected from wavelengths satisfying condition of:0&#x3c;&#x3bb;&#x2212;&#x3bb;&#x2264;5.36&#xd7;10&#x3bb;&#x2212;&#xd7;5.83&#xd7;10&#x3bb;32.4 where a first emission wavelength is &#x3bb;[nm], a second emission wavelength shorter than the first emission wavelength is &#x3bb;[nm], and a middle wavelength between the first emission wavelength and the second emission wavelength is &#x3bb;[nm]. At least one of the plurality of surface emitting lasers has an emission wavelength different from an emission wavelength of another surface emitting laser.

Surface emitting laser element, illumination device, projection device, measurement device, robot, electronic apparatus, mobile body, and modeling device

There is provided an improved light source including a plurality of light emitting elements in a surface. An arrangement of the plurality of light emitting elements fulfills, in an assumed projection area, an element interval at which irradiation light beams of the plurality of light emitting elements overlaps, and fulfills an element interval at which a speckle pattern of each of the irradiation light beams obtained in the assumed projection area is different for each of the irradiation light beams.

Light source, projection device, measurement device, robot, electronic device, mobile object, and shaping apparatus

A phototransistor includes a first emitter region, a first base region having at least a portion exposed to a light-receiving side, and a first collector region in this order from the light-receiving side in a depth direction. The first collector region includes a second collector region and a third collector region that is in contact with a downstream side of the second collector region in the depth direction and has a resistance lower than that of the second collector region. The phototransistor further includes a first region that is spaced away from the first base region at an outer side of the first base region on a light-receiving side surface thereof, the first region having a conductivity type opposite to that of the first collector region.

Growing community of inventors

Kyoto, Japan

Yoshihiko Miki