Samsung Electronics Co., Ltd.

Yoshihiko Hayashi

Jae-Hong Kim

Sung-Yeol Kim

Akinori Okubo

Shin Ki Jeong

Hyung-Sun Ryu

Chang Eun Lee

Si Young Koh

Shinya Namioka

Jang Yeob Lee

A semiconductor device including a signal generator and decoding and timing skew adjusting circuit is provided. The signal generator is configured to receive n multi-level signals having m signal levels and convert the n multi-level signals into n*(m&#x2212;1) single level signals having two signal levels. The decoding and timing skew adjusting circuit is configured to receive the single level signals, perform a predefined operation on the single level signals to generate an output signal, and compensate for timing skew between the n multi-level signals, using the single level signals. The n and m are natural numbers, where n&#x3e;=2 and m&#x3e;=3.

Semiconductor device including a high-speed receiver being capable of adjusting timing skew for multi-level signal and testing equipment including the receiver

A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.

Test device and imaging device including the same

Growing community of inventors

Seongnam-si, South Korea

Yoshihiko Hayashi