Olympus Corporation

The University of Tokyo

Kyushu University

Yoshiharu Ajiki

Yasuo Sasaki

Kiyoshi Matsumoto

Isao Shimoyama

Koichi Karaki

Kimihiko Nishioka

Chihaya Adachi

Takuya Tsukagoshi

Yusuke Takei

Kentaro Noda

Tetsuo Kan

Masayuki Yahiro

Akiko Hamada

Tetsuro Kan

Provided is a photodetector including: an organic semiconductor () having protrusions; a metal layer () added onto the organic semiconductor (), for promoting at least one of localized plasmon resonance and surface plasmon resonance in which electrons are excited through irradiation of detection light; and a semiconductor () forming a junction with the metal layer (), for allowing electrons excited through the plasmon resonance to pass through the junction () with the metal layer ().

Photodetector

Provided is a scanning near-field optical microscope capable of obtaining, in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscopeaccording to the present invention includes: a light irradiating partfor emitting illumination light toward a samplea light receiving partfor receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating partand an incident side of the light receiving partand an ultrahigh-wavenumber transmitting mediumfor transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

Near-field optical microscope, near-field optical probe, and sample observation method

Growing community of inventors

Tokyo, Japan

Yoshiharu Ajiki