Fujitsu Corporation

Yoshiaki Nagatomi

Norihiro Nakatsuhama

Tomohide Yamamoto

Kenichi Kawabata

Naoya Watanabe

Yoshiyuki Kubo

Tetsuya Yoshida

Hironori Aono

Kenji Nakata

Masatoshi Konishi

Tomohiro Wada

A semiconductor device includes a first power supply terminal, a second power supply terminal, a comparison circuit coupled to the first power supply terminal and the second power supply terminal to produce at an output node thereof a signal responsive to a difference between a potential of the first power supply terminal and a potential of the second power supply terminal, and a core circuit coupled to the output node of the comparison circuit to perform a test operation in response to the signal.

Semiconductor device and entry into test mode without use of unnecessary terminal

A semiconductor device in which input terminals for external interrupts can be set as desired. A plurality of external input terminals can be specified as interrupt terminals which output an input signal to an external interrupt circuit via an interrupt terminal selector. A selection control circuit specifies whether a plurality of external input terminals are used as interrupt terminals. According to the selection control circuit, the interrupt terminal selector outputs to the external interrupt circuit an input signal entered from an external input terminal which is specified as an interrupt terminal out of the plurality of external input terminals.

Semiconductor device and microcontroller

An information processing device capable of accepting a communication request from another information processing device without fail, regardless of whether the device is in a standby state or not. A first condition detection circuit detects, synchronously with a clock signal, a communication start condition for starting communication with the other information processing device, and a second condition detection circuit detects, asynchronously with the clock signal, the communication start condition for starting communication with the other information processing device. A selector circuit selects a suitable one of the first and second condition detection circuits.

Information processing device

Growing community of inventors

Kawasaki, Japan

Yoshiaki Nagatomi