Hitachi, Ltd.

Hitachi-ge Nuclear Energy, Ltd.

Hitachi Nuclear Engineering Co., Ltd.

Yoshiaki Nagashima

Hiroyuki Nakano

Masahiro Koike

Masahiro Miki

Mitsuru Odakura

Masao Endou

Kojiro Kodaira

Tetsuya Matsui

Fuminobu Takahashi

Hajime Umehara

Yoshihiro Michiguchi

Hirohisa Mizota

Kenichi Fujiwara

Kazuyuki Nakahata

Masao Sato

There is provided an analysis model creation method which is capable of simply and quickly creating an accurate analysis model with respect to a structure including a crystalline material. In order to solve a problem described above, there is provided a model creation method of an analysis region used in numeral analysis, the method including a step of designating a crystal growth direction if a region is a region including crystallinity including acoustic anisotropy in the analysis region, a step of selecting partial image data to which the crystallinity of the region is reflected, a step of rotating and operating the partial image data along the crystal growth direction, and a step of creating image data which is covered in the region designated using the rotated partial image data.

Model creation method and device, and inspection device using the same

A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.

Nondestructive inspection apparatus and nondestructive inspection method using guided wave

Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensorincluded in a guided wave inspection deviceis mounted to the outer surface of piping. A guided wave is propagated to an inspection area of the piping. If a defective portion exists, the guided wave sensorreceives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection devicecan acquire receive information including receive information derived from the defect.

A nondestructive inspection apparatus using a guided wave having waveform forming part that form a transmission waveform; a transmitting element for generating a guided wave within an object under inspection; a receiving element for receiving a reflection wave of the guided wave from an inspection region of the object under inspection; an analyzing element for outputting inspection information which is acquired based upon the reception waveform of the reflection wave received by the receiving element; and a display for displaying the inspection information.

Nondestructive inspection apparatus and nondestructive inspection method using elastic guided wave

Ultrasonic waves from a transmit device are transmitted to an object subject to measurement. A surface reflected wave propagated in a contact medium and reflected at the surface of a tube and bottom surface reflected waves passing through an oxidation layer on the tube and reflected at the inner surface of the tube are convened into electric signals. A feature extracting part 5, in consideration of a correlation relationship of energy with respect to the frequency of a received signal, based on the received signal of ultrasonic waves converted to electric signals, extracts a signal feature data determined beforehand which has a strong correlation relationship with the thickness of a measured part. Based on the extracted signal feature data, a thickness conversion part references a relationship storage part which has stored therein beforehand a function that shows a relationship between the signal feature data and the thickness of the oxidation layer, and obtains the thickness of the oxidation layer.

Method and apparatus for measuring thickness of layer using acoustic

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Hitachi, Japan

Yoshiaki Nagashima