Seoul National University

Yoon Seok Oh

Kee Hoon Kim

Disclosed herein is a method and system for measuring magnetoelectric susceptibility. The system includes a magnet supplying a DC magnetic bias to a magnetoelectric sample, an AC drive coil applying an AC magnetic field to the magnetoelectric sample, a charge amplifier amplifying an electric charge signal of the magnetoelectric sample oscillating by the AC magnetic field, and a phase sensitive detector detecting the voltage signal produced by the charge amplifier while supplying induction current to the AC drive coil. Accordingly, it is possible to provide a highly sensitive system for measuring magnetoelectric susceptibility, which is essential for research on multiferroic and magnetoelectric bulk and thin film materials at room temperature, and can also operate in the physical property measurement system (PPMS, manufactured by Quantum Design Co., Ltd.) for measurements under low temperature and high magnetic field environments.

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Gunpo, South Korea

Yoon Seok Oh