Avago Technologies General IP (singapore) Pte. Ltd.

Lsi Corporation

Yoon Liong Liow

Shaohua Yang

Xuebin Wu

Wu Chang

Wei Zhang

Yang Han

Dan Liu

Qi Zuo

Kaitlyn T Nguyen

Yuqing Yang

Kapil Gaba

An apparatus for processing data includes a data detector configured to detect data values in data sectors to yield detected data, a data decoder configured to decode the detected data, wherein the data detector and the data decoder are configured to process the data sectors in a series of global iterations, a memory configured to store parity sector soft information, and a scheduler configured to control overlapping reprocessing of a failed sector in the data detector and the data decoder based on the parity sector soft information with processing of another data sector in the data detector and the data decoder.

Systems and methods for overlapping parity sectors

The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for detecting patterns in a data stream.

Systems and methods for enhanced sync mark mis-detection protection

Embodiments are related to systems and methods for data processing, and more particularly to systems and methods for calibration during data processing. As an example, a data processing system is discussed that includes a sample averaging circuit operable to average digital samples from an analog to digital converter circuit over multiple instances of an analog input to yield an X-average output, and a selector circuit operable to select one of the digital samples or the X-average output as a processing output.

Systems and methods for data retry using averaging process

Methods and apparatus are provided for detecting a sync mark in a storage system, such as a hard disk drive. A sync mark is detected in a storage system by obtaining one or more branch metrics from a data detector in the storage system; generating one or more sync mark metrics using the one or more branch metrics from the data detector; and identifying the sync mark based on the sync mark metrics. An input data set is optionally compared with a plurality of portions of a sync mark pattern to yield corresponding comparison values and the comparison values can be summed to obtain at least one result. A sync mark found signal is asserted based upon the at least one result.

Sync mark detection using branch metrics from data detector

Systems and methods for enhanced sync mark detection

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San Ramon, CA, United States of America

Yoon Liong Liow