Asml Netherlands B.v.

Netskope, Inc.

Other

Yongxin Wang

Zhonghua Dong

Rui-Ling Lai

Zhongwei Chen

Siying Yang

Yi Zhang

Prathamesh Deshpande

Yihua Liao

Dipak Patil

Weiming Ren

Xuerang Hu

Joe Wang

Kenichi Kanai

Wei Fang

Zhong-wei Chen

Lingling Pu

Qian Zhang

Jan Bex

Bo Wang

Nickolay Stepanenko

Ronny Hendrix

Lidewij Elisa Cornelissen

Robert Anton Brookhuis

Detector modules, systems and methods for detecting signal beams are disclosed using a detector module and a support comprising a feedthrough. Furthermore, apparatuses, systems, and methods for sealing a vacuum system configured to provide an atmospheric environment and a vacuum chamber environment are disclosed. In some embodiments, a printed circuit board (PCB) comprising a first side for exposing to the atmospheric environment and a second side for exposing to the vacuum chamber environment and for covering an aperture in the vacuum chamber environment, wherein the second side is opposite to the first side. The apparatuses, systems, and methods may include a rigid body on the first side of the PCB and a device connected to the second side of the PCB and positioned on a portion of the PCB that covers the aperture. The PCB may be configured to provide an interface between the device and the rigid body.

Printed circuit board for sealing vacuum system

Detectors and detection systems are disclosed. According to certain embodiments, a substrate comprises a plurality of sensing elements including a first plurality of the sensing elements and a second plurality of the sensing elements, and a plurality of sections configured to connect the first plurality to an output, and connect the second plurality to an output. Switching regions may be provided between the sensing elements that are configured to connect two or more sensing elements. The switching region may be controlled based on signals generated in response to the sensing elements receiving electrons with a predetermined amount of energy and/or beam intensity.

Architecture for large active area high speed detector

A time of flight (TOF) ranging system includes multiple emitters, each emitting a signal whose intensity, amplitude or polarization is modulated by a corresponding delayed modulation signal. Each delayed modulation signal is a delayed version of a time varying multi-valued modulation signal, the amount of delay being determined by a spatial position of the emitter and direction of a target point on the target. The signal reflected by the target is correlated with the original modulation signal to generate an output having a peak representing the TOF to the target point. The same process is performed to detect other target points. Another TOF ranging system includes one emitter and multiple detectors; the signal from each detector is delayed in a similar manner and their sum is correlated with the original modulation signal to generate an output representing TOF. Yet another TOF ranging system includes multiple emitters and multiple detectors.

Time of flight ranging system using multi-valued signals

A detector may be provided with a sensing element or an array of sensing elements, each of the sensing elements may have a corresponding gain element. A substrate may be provided having a sensing element and a gain element integrated together. The gain element may include a section in which, along a direction perpendicular to an incidence direction of an electron beam, a region of first conductivity is provided adjacent to a region of second conductivity, and a region of third conductivity may be provided adjacent to the region of second conductivity. The sensing element may include a section in which, along the incidence direction, a region of fourth conductivity is provided adjacent to an intrinsic region of the substrate, and the region of second conductivity may be provided adjacent to the intrinsic region.

Charged particle detector with gain element

A detector may be provided with an array of sensing elements. The detector may include a semiconductor substrate including the array, and a circuit configured to count a number of charged particles incident on the detector. The circuit of the detector may be configured to process outputs from the plurality of sensing elements and increment a counter in response to a charged particle arrival event on a sensing element of the array. Various counting modes may be used. Counting may be based on energy ranges. Numbers of charged particles may be counted at a certain energy range and an overflow flag may be set when overflow is encountered in a sensing element. The circuit may be configured to determine a time stamp of respective charged particle arrival events occurring at each sensing element. Size of the sensing element may be determined based on criteria for enabling charged particle counting.

Semiconductor charged particle detector for microscopy

An improved apparatus and method for enhancing an image, and more particularly an apparatus and method for enhancing an image through cross-talk cancellation in a multiple charged-particle beam inspection are disclosed. An improved method for enhancing an image includes acquiring a first image signal of a plurality of image signals from a detector of a multi-beam inspection system. The first image signal corresponds to a detected signal from a first region of the detector on which electrons of a first secondary electron beam and of a second secondary electron beam are incident. The method includes reducing, from the first image signal, cross-talk contamination originating from the second secondary electron beam using a relationship between the first image signal and beam intensities associated with the first secondary electron beam and the second secondary electron beam. The method further includes generating a first image corresponding to first secondary electron beam after reduction.

Cross-talk cancellation in multiple charged-particle beam inspection

The present disclosure describes an image forming element having a semiconductor chip with micro-electro-mechanical-system (MEMS) devices and voltage generators, each voltage generator being configured to generate a voltage used by one or more of the MEMS devices. A floating ground may be used to add a voltage to the voltage generated by the voltage generators. The semiconductor chip may include electrical connections, where each voltage generator is configured to provide the voltage to the one or more MEMS devices through the electrical connections. The MEMS devices may define a boundary in the semiconductor chip within which the MEMS devices, the voltage generators, and the electrical connections are located. Each MEMS device may generate an electrostatic field to manipulate an electron beamlet of a multi-beam charged particle microscope. The MEMS devices may be organized into groups based on a distance to a reference location (e.g., optical axis) in the semiconductor chip.

MEMS image forming element with built-in voltage generator

Systems and methods for implementing a detector array are disclosed. According to certain embodiments, a substrate comprises a plurality of sensing elements including a first element and a second element, and a switching region therebetween configured to connect the first element and the second element. The switching region may be controlled based on signals generated in response to the sensing elements receiving electrons with a predetermined amount of energy.

Field programmable detector array

Systems and methods for implementing a detector array are disclosed. According to certain embodiments, a substrate comprises a plurality of sensing elements including a first element and a second element. The detector comprises a switching element configured to connect the first element and the second element. The switching region may be controlled based on signals generated in response to the sensing elements receiving electrons with a predetermined amount of energy.

Switch matrix design for beam image system

A multi-cell detector may include a first layer having a region of a first conductivity type and a second layer including a plurality of regions of a second conductivity type. The second layer may also include one or more regions of the first conductivity type. The plurality of regions of the second conductivity type may be partitioned from one another, preferably by the one or more regions of the first conductivity type of the second layer. The plurality of regions of the second conductivity type may be spaced apart from one or more regions of the first conductivity type in the second layer. The detector may further include an intrinsic layer between the first and second layers.

Multi-cell detector for charged particles

An in-vehicle power supply system includes multiple power cells of identical mechanical size, multiple power pods each holding multiple power cells, and a mechanical transport system to move and exchange power cells with pumps at power cell exchange and charging stations. Each power cell and each power pod includes a control unit and a power converter with a magnetic core. The power cells held by a power pod are arranged parallel to each other and coupled to the power pod by magnetic field coupling. Power is transferred between the power pod and the power cells bidirectionally using magnetic field of different frequencies, and data and commands are communicated between them using magnetic field of another different frequency. Load balancing among power cells within a power pod and among power pods can be achieved. The structure of the power cell exchange and charging stations is also described.

Power supply system for electric vehicles

Systems and methods are provided for charged particle detection. The detection system can comprise a signal processing circuit configured to generate a set of intensity gradients based on electron intensity data received from a plurality of electron sensing elements. The detection system can further comprise a beam spot processing module configured to determine, based on the set of intensity gradients, at least one boundary of a beam spot; and determine, based on the at least one boundary, that a first set of electron sensing elements of the plurality of electron sensing elements is within the beam spot. The beam spot processing module can further be configured to determine an intensity value of the beam spot based on the electron intensity data received from the first set of electron sensing elements and also generate an image of a wafer based on the intensity value.

Method and apparatus for charged particle detection

Detectors and detection systems are disclosed. According to certain embodiments, a detector comprises a substrate comprising a plurality of sensing elements including a first sensing element and a second sensing element, wherein at least the first sensing element is formed in a triangular shape. The detector may include a switching region configured to connect the first sensingelement and the second sensing element. There may also be provided a plurality of sections including a first section connecting a first plurality of sensing elements to a first output and a second section connecting a second plurality of sensing elements to a second output. The section may be provided in a hexagonal shape.

Pixel shape and section shape selection for large active area high speed detector

The disclosed technology teaches a method of calibrating a user confidence or risk score that expresses evaluation of user behavior that was not compliant with an organization's security policies, including configuring components of the user confidence or risk score, comprising configuring categorical alert weights, categorized by severity, responsive to administrator controls, for alerts to be generated due to an activity by the user that the organization's security policies treat as risky, and configuring a decay factor that attenuates the alert weights as time passes, responsive to an administrator sensitivity control. The disclosed method includes causing display of resulting user behavior evaluation examples, based on activity examples for user examples, comprising causing display of a time series of the user confidence or risk scores for the activity examples for the user examples, and a resulting user confidence or risk score for the user examples.

Growing community of inventors

San Ramon, CA, United States of America

Yongxin Wang