Samsung Electronics Co., Ltd.

Yongmin Ju

Hyungwoo Lee

Sangjoon Kim

Seungchul Jung

Sungmeen Myung

A neural network apparatus includes: a plurality of memory cells each comprising a variable resistance element and a first transistor; a plurality of bit lines extending in a first direction; and a plurality of word lines extending in a second direction, crossing the bit lines and respectively connected to the first transistor of the plurality of memory cells; a plurality of sub-column circuits each comprising memory cells of the memory cells connected in parallel along the first direction; and a column circuit comprising two or more of the sub-column circuits connected in series along the second direction, wherein, when a neural network operation is performed, the column circuit outputs a summation current to a bit line connected to the column circuit based on voltage applied to the plurality of word lines.

Neural network apparatus

An apparatus for performing in-memory processing includes a memory cell array of memory cells configured to output a current sum of a column current flowing in respective column lines of the memory cell array based on an input signal applied to row lines of the memory cells, a sampling circuit, comprising a capacitor connected to each of the column lines, configured to be charged by a sampling voltage of a corresponding current sum of the column lines, and a processing circuit configured to compare a reference voltage and a currently charged voltage in the capacitor in response to a trigger pulse generated at a timing corresponding to a quantization level, among quantization levels, time-sectioned based on a charge time of the capacitor, and determine the quantization level corresponding to the sampling voltage by performing time-digital conversion when the currently charged voltage reaches the reference voltage.

Apparatus and method with in-memory processing

An in-memory processing apparatus includes: a memory cell array comprising memory cell groups configured to generate current sums of column currents flowing through respective column lines in response to input signals input through row lines; voltage controlled delay circuits configured to output, in response to an input of a start signal at a first time point, stop signals at second time points delayed by delay times determined based on magnitudes of applied sampling voltages corresponding to the current sums; a time-digital converter configured to perform time-digital conversion at the second time points; and sampling resistors connected to the column lines, wherein the time-digital converter is configured to reset a counter at the first time point, and output counting values as digital values at the second time points.

Apparatus and method with in-memory delay dependent processing

Provided are processing and an electronic device including the same. The processing apparatus includes a bit cell line comprising bit cells connected in series, a mirror circuit unit configured to generate a mirror current by replicating a current flowing through the bit cell line at a ratio, a charge charging unit configured to charge a voltage corresponding to the mirror current as the mirror current replicated by the mirror circuit unit is applied, and a voltage measuring unit configured to output a value corresponding to a multiply-accumulate (MAC) operation of weights and inputs applied to the bit cell line, based on the voltage charged by the charge charging unit.

Processing apparatus and electronic device including the same

An in-memory processing apparatus includes: a memory cell array comprising memory cell groups configured to generate current sums of column currents flowing through respective column lines in response to input signals input through row lines; voltage controlled delay circuits configured to output, in response to an input of a start signal at a first time point, stop signals at second time points delayed by delay times determined based on magnitudes of applied sampling voltages corresponding to the current sums; and a time-digital converter configured to perform time-digital conversion at the second time points.

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Suwon-si, South Korea

Yongmin Ju