Samsung Electronics Co., Ltd.

Yongki Lee

Bohdan Karpinskyy

Yunhyeok Choi

Yongsoo Kim

Jieun Park

Kyoungmoon Ahn

Eunhye Oh

Michael Choi

Jisu Kang

Mijung Noh

Hyochul Shin

Sungno Lee

Taewook Park

Juyeon Lee

Jinwoo Park

Youngjae Cho

Kyoungjun Moon

Heejune Lee

Heechang Hwang

Younghyo Park

Sumin Noh

A device is provided. The device includes: a plurality of physically unclonable function (PUF) cells, each of the plurality of PUF cells including at least one logic gate and being configured to generate an output signal based on at least one threshold level of the at least one logic gate; a signal generator configured to generate an input signal that is provided to each of the plurality of PUF cells; and a controller configured to, in a test mode, generate a control signal to control the signal generator to vary the input signal to control the plurality of PUF cells to output a plurality of output signals according to the input signal, and identify at least one weak PUF cell from among the plurality of PUF cells based on the output signal generated by the at least one weak PUF cell being an unstable output signal. The controller is further configured to disconnect the plurality of PUF cells from the signal generator in a normal mode.

Device and method for providing physically unclonable function with high reliability

An operation method of a memory device includes programming a test pattern in a normal area, obtaining locations of error bits with respect to the test pattern and an error count for each error bit location, and repairing faulty cells included in the normal area with redundancy cells in a redundancy area based on the locations of the error bits and the error counts.

Operating and testing semiconductor devices

Provided is a storage device including a memory device configured to store original data; and a controller configured to control the memory device, the controller including a first error correction circuit configured to correct an error of the original data, and a second error correction circuit configured to correct an error of the original data, a maximum number of correctable error bits of the second error correction circuit being greater than a maximum number of correctable error bits of the first error correction circuit, a mapping memory configured to store at least some of parity bits generated by the second error correction circuit and store an address of the memory device at which the original data is stored; and a control block configured to control the first error correction circuit, the second error correction circuit, and the mapping memory.

Storage device including mapping memory and method of operating the same

An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.

Analog-to-digital conversion circuit and receiver including same

A security device generates a key based on a physically unclonable function (PUF). The security device includes a physically unclonable function (PUF) block, an integrity detector, and a post processor. The PUF block outputs a plurality of first random signals and a plurality of corresponding first inverted random signals each having a logic level opposite to that of each of the plurality of corresponding first random signals. The integrity detector determines data integrity of the plurality of first random signals by using the plurality of first random signals and the plurality of corresponding first inverted random signals. The post processor generates a first row key that includes validity signals satisfying the data integrity.

Security device generating key based on physically unclonable function and method of operating the same

A test method is provided to test a semiconductor integrated circuit including an analog-to-digital converter and/or a digital-to-analog converter. An analog test signal having a test pattern is generated using an analog test signal generator or a digital test signal having the test pattern using a digital test signal generator. An analog output signal corresponding to the test pattern is generated by applying, as a digital input signal, the digital test signal having the test pattern to a digital-to-analog converter responsive to generation of the digital test signal. A digital output signal corresponding to the test pattern is generated by applying, as an analog input signal, the analog test signal having the test pattern or the analog output signal corresponding to the test pattern to an analog-to-digital converter. A normality of the semiconductor integrated circuit is determined based on the digital output signal corresponding to the test pattern.

Semiconductor integrated circuit and method of testing the same

A security device and an operating method thereof, which generate masking data for masking a key on the basis of a physically unclonable function (PUF), are provided. The security device includes a PUF circuit including a plurality of PUF cells outputting random key data and masking data, a key generator configured to generate a key through post-processing performed on the random key data, and a masking module configured to mask and store the key by using the masking data, wherein the random key data and the masking data are generated by different PUF cells.

Security device for generating masking data based on physically unclonable function and operating method thereof

An apparatus includes an integrated circuit and a plurality of conducting wires disposed on the integrated circuit. The integrated circuit includes: (i) a signal generation circuit, which is configured to generate random signal and selection signal based on random or pseudo-random numbers, (ii) a transmitting circuit configured to select at least one from among the plurality of conducting wires based on the selection signal and to output the random signal through the at least one conducting wire, and (iii) a receiving circuit configured to detect an invasive attack on the integrated circuit based on signal received through the at least one conducting wire.

Apparatus and methods for detecting invasive attacks within integrated circuits

The present disclosure relates to an integrated circuit and a method of using the integrated circuit used to perform authentication using a challenge-response method. The challenge-response method includes an internal challenge generator, a physically unclonable function (PUF) block, and a response generator. The internal challenge generator is configured to receive a challenge, generate a plurality of internal challenges corresponding to the challenge, and generate at least one valid internal challenge among the plurality of internal challenges using screen information. The physically unclonable function (PUF) block is configured to generate a plurality of valid internal responses respectively changing according to the plurality of valid internal challenges. The response generator is configured to output a response generated using the plurality of valid internal responses.

Integrated circuit performing authentication using challenge-response protocol and method of using the integrated circuit

Systems and methods are described based on an integrated circuit that performs a challenge-response physically unclonable function (PUF). The PUF is used for challenge-response authentication. The integrated circuit includes a PUP block configured to output an n-bit internal response corresponding to a challenge that requests a response where n is an integer greater than 1 and a response generator configured to calculate a Hamming weight of the internal response and output the response by comparing the Hamming weight with at least one reference.

Growing community of inventors

Suwon-si, South Korea

Yongki Lee