Other

Shenzhen University

Yonghong Shao

Xiaomin Zheng

Meiting Wang

A point-scanning structured illumination-based super-resolution microscopic imaging system includes a first laser assembly, a second laser assembly, a scanner, a detector and a computing terminal. The first laser assembly and the second laser assembly are configured to generate an excitation light and an annular STED light, respectively. The scanner is configured to control the excitation light and the annular STED light to scan and excite a sample. The detector is configured to acquire fluorescence signals to obtain fluorescence-structured images. The computing terminal is configured to reconstruct a super-resolution image based on the fluorescence-structured images. A microscopic imaging method is also provided, in which the to-be-imaged sample is scanned and excited by an excitation light and an annular STED light to obtain a stripe structured-light image beyond the diffraction limit, and the fluorescence signals are collected by a detector synchronously and pointwise in real time.

Point-scanning structured illumination-based super-resolution microscopic imaging system and method

The present invention provides a surface plasmon resonance (SPR) detection system. This system utilizes a detection light path to form a detection image containing incident angle information and wavelength information. During testing, full-spectrum scan is performed first to obtain a resonance wavelength of a sample. Then, partial-spectrum scanning is performed by continuously tracking the resonance wavelength, and the number of scanning points in each scanning cycle is controlled according to specific situation to shorten the scanning time, thereby obtaining the resonance wavelength of the sample in real time. When the refractive index of the sample changes, the corresponding resonance wavelength changes as well; by obtaining the change of the resonance wavelength, variation of the reflective index of the sample is calculated, which is rapid SPR detection of wavelength modulation.

Spectrum-scanned SPR imaging detection system

The present invention provides a surface plasmon resonance (SPR) detection system and method. This system utilizes a detection light path to form a detection image containing incident angle information and wavelength information. During testing, full-spectrum scan is performed first to obtain a resonance wavelength of a sample. Then, partial-spectrum scanning is performed by continuously tracking the resonance wavelength, and the number of scanning points in each scanning cycle is controlled according to specific situation to shorten the scanning time, thereby obtaining the resonance wavelength of the sample in real time. When the refractive index of the sample changes, the corresponding resonance wavelength changes as well; by obtaining the change of the resonance wavelength, variation of the reflective index of the sample is calculated, which is rapid SPR detection of wavelength modulation.

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Shenzhen, China

Yonghong Shao