Nxp Usa, Inc.

Shanghai Bluevascular Medtech Co., Ltd.

Shanghai Microport Endovascular Medtech (group) Co., Ltd.

Shanghai Vasolutions Medtech Co., Ltd.

Yongfeng Zhu

Qing Zhu

Qiyi Luo

Zhonghua Li

Biao Li

Linlin Zhang

Jianchao Han

Yanbin Gao

Dingguo Huang

Wenhui Jiao

Liwen Wang

Zhiyong Hao

Yuliang Zhou

Dongmei Yan

Mengqin Liu

Zhikai Xing

Qingru Ji

The present invention provides a filter device, including a filtering part, a constraining part, a stent part, and a connecting part. The filtering part has a first end and a second end opposite to each other. The constraining part is degradable and at least configured to constrain the first end of the filtering part. The stent part has a first end and a second end opposite to each other. The first end of the stent part is connected to the second end of the filtering part, and disposed coaxial with the filtering part. The connecting part is disposed on one or more of the first end of the filtering part and the second end of the stent part, and is configured to connect to an external mechanism, and the constraining part is further configured to constrain the second end of the stent part when the connecting part is disposed at the second end of the stent part. The present invention can be taken out from the human body and can also be partially degraded in the human body so that the occurrence rate of long-term complications is reduced, and secondary surgery can thus be avoided.

Filter device

Testing an integrated circuit (IC) that has a set of nominally similar cores and pairs of test data input (TDI) and test data output (TDO) pads common to the different cores. Similar scan chains in parallel in the different cores provide response signals as functions of corresponding TDI signals. Respective combined TDO signals are provided to the TDO pads. In the absence of a defect, the combined TDO signals are asserted and de-asserted like the response signals from corresponding chains in the different cores and like corresponding expected response signals. The combined TDO signals are different from the corresponding expected response signals in the presence of a defect in at least one of the cores. If the result is a fail, the ATE may identify a defective core using a diagnosis module in the IC providing response signals from a selected core.

Testing multi-core integrated circuit with parallel scan test data inputs and outputs

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Shanghai, China

Yongfeng Zhu