Growing community of inventors

Wilton, CT, United States of America

Yongdong Wang

Average Co-Inventor Count = 2.23

ph-index = 13

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 483

Yongdong WangDavid H Tracy (11 patents)Yongdong WangMing Gu (8 patents)Yongdong WangPaul G Saviano (5 patents)Yongdong WangJerry E Cahill (5 patents)Yongdong WangAlan M Ganz (5 patents)Yongdong WangJohn Girdner Atwood (4 patents)Yongdong WangJohn C Voyta (4 patents)Yongdong WangMichael R Gambini (4 patents)Yongdong WangEdward J Lakatos (4 patents)Yongdong WangJeff Levi (4 patents)Yongdong WangIsrael Metal (4 patents)Yongdong WangGeorge Sabak (4 patents)Yongdong WangKoichi Nishikida (4 patents)Yongdong WangDar Bahatt (3 patents)Yongdong WangBernhard H Radziuk (3 patents)Yongdong WangEnrico G Picozza (3 patents)Yongdong WangDavid A Huppler (3 patents)Yongdong WangBruce E DeSimas, Ii (3 patents)Yongdong WangDonald Kuehl (2 patents)Yongdong WangStacey Simonoff (2 patents)Yongdong WangSusan Atwood-Stone, Legal Representative (2 patents)Yongdong WangDon Kuehl (2 patents)Yongdong WangRobert Alan Hoult (1 patent)Yongdong WangGitesh Kumar (1 patent)Yongdong WangJuan C Ivaldi (1 patent)Yongdong WangJohn P Coates (1 patent)Yongdong WangBruce De Simas (1 patent)Yongdong WangBruce R Kowalski (1 patent)Yongdong WangChristopher B Hanna (1 patent)Yongdong WangYongdong Wang (34 patents)David H TracyDavid H Tracy (46 patents)Ming GuMing Gu (9 patents)Paul G SavianoPaul G Saviano (15 patents)Jerry E CahillJerry E Cahill (12 patents)Alan M GanzAlan M Ganz (10 patents)John Girdner AtwoodJohn Girdner Atwood (42 patents)John C VoytaJohn C Voyta (40 patents)Michael R GambiniMichael R Gambini (13 patents)Edward J LakatosEdward J Lakatos (11 patents)Jeff LeviJeff Levi (4 patents)Israel MetalIsrael Metal (4 patents)George SabakGeorge Sabak (4 patents)Koichi NishikidaKoichi Nishikida (4 patents)Dar BahattDar Bahatt (21 patents)Bernhard H RadziukBernhard H Radziuk (9 patents)Enrico G PicozzaEnrico G Picozza (3 patents)David A HupplerDavid A Huppler (3 patents)Bruce E DeSimas, IiBruce E DeSimas, Ii (3 patents)Donald KuehlDonald Kuehl (10 patents)Stacey SimonoffStacey Simonoff (2 patents)Susan Atwood-Stone, Legal RepresentativeSusan Atwood-Stone, Legal Representative (2 patents)Don KuehlDon Kuehl (2 patents)Robert Alan HoultRobert Alan Hoult (33 patents)Gitesh KumarGitesh Kumar (3 patents)Juan C IvaldiJuan C Ivaldi (3 patents)John P CoatesJohn P Coates (2 patents)Bruce De SimasBruce De Simas (2 patents)Bruce R KowalskiBruce R Kowalski (2 patents)Christopher B HannaChristopher B Hanna (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Cerno Bioscience LLC (15 from 15 patents)

2. The Perkin-elmer Corporation (4 from 801 patents)

3. Perkinelmer Instruments LLC (4 from 33 patents)

4. Applied Biosystems, LLC (3 from 532 patents)

5. Applera Corporation (3 from 496 patents)

6. Perkinelmer Las, Inc. (3 from 90 patents)

7. University of Washington (1 from 2,103 patents)

8. Tropix, Inc. (1 from 76 patents)


34 patents:

1. 12142471 - Direct and automatic chromatography-mass spectral analysis

2. 11694884 - Mass spectral analysis of large molecules

3. 11404259 - Reliable and automatic mass spectral analysis

4. 10755905 - Qualitative and quantitative mass spectral analysis

5. 8927925 - Interactive method for identifying ions from mass spectral data

6. 8865473 - Luminescence detecting apparatuses and methods

7. 8803080 - Self calibration approach for mass spectrometry

8. 8278114 - Method for measuring luminescence at a luminescence detection workstation

9. 8010306 - Methods for calibrating mass spectrometry (MS) and other instrument systems and for processing MS and other data

10. 7904253 - Determination of chemical composition and isotope distribution with mass spectrometry

11. 7781729 - Analyzing mass spectral data

12. 7670848 - Method for measuring luminescence at a luminescence detection workstation

13. 7656521 - Method of instrument standardization for a spectroscopic device

14. 7577538 - Computational method and system for mass spectral analysis

15. 7529629 - Computational methods and systems for multidimensional analysis

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12/28/2025
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