Samsung Electronics Co., Ltd.

Yong-won Lee

Jung-Je Bang

Kwang-Kyu Bang

Hyun-Tae Jang

Kyeong-seon Shin

Jae-Heung Ye

Hyen-wook Ju

Jeong-kyu Kim

Sae-bom Lee

Jae-deok Lim

Hye-in Park

Chan-beom Jeong

A shield can device is provided. The shield can device includes a frame which is fixed to a printed circuit board (PCB) and surrounds at least one circuit device as an electromagnetic shielding target, a cover which is coupled to the frame and closes an opening formed in a top of the frame, and a plurality of contact projections which are formed between the frame and the cover and allow the frame and the cover to be in electrical contact with each other.

Shield can device for shielding electromagnetic wave

Provided are a semiconductor device including a fuse focus detector, a fabrication method thereof and a laser repair method. In a chip region, fuses may be formed at a first level. A fuse focus detector including first and second conductive layers may be formed in a scribe line region. The first conductive layer may be formed at the first level, while the second conductive layer may be formed at a different level. For a laser repair method, a target region may be divided into sub-regions. In one selected sub-region, the fuse focus detector may be laser scanned in a direction for a reflection light measurement providing information on a thickness of the fuse focus detector. Using the thickness information, a focus offset value of a fuse in the selected sub-region may be calculated. When the focus offset value is within an allowable range, fuse cutting may be performed.

Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector

Growing community of inventors

Suwon-si, South Korea

Yong-won Lee