Hewlett-Packard Development Company, L.p.

Colorado State University Research Foundation

Yong Wang

Karl Joseph Bois

Mark D Frank

Jerimy Nelson

David W Quint

Tong Zhang

Daniel R Tretter

Jason Harold Culler

Jorge J Rocca

Shad R Shepston

David Alessi

Bradley M Luther

Mark Berrill

Miguel A Larotonda

Alex McHardy

Methods and integrated systems for camera motion analysis and moving object analysis and methods of extracting semantics mainly from camera motion parameters in videos and video segments without shot changes are described. Typical examples of such videos are a home video taken by a digital camera and a segment, or clip, of a professional video or film. The extracted semantics can be directly used in a number of video/image understanding and management applications, such as annotation, browsing, editing, frame enhancement, key-frame extraction, panorama generation, printing, retrieval, summarization. Automatic methods of detecting and tracking moving objects that do not rely on a priori knowledge of the objects are also described. The methods can be executed in real time.

Video content understanding through real time video motion analysis

An embodiment of this invention provides a circuit and method for reducing the number of electronic components needed to calibrate circuits on an IC. A multiplexer is located on the IC where the outputs of a plurality of circuits located on the IC are each connected to a separate data input of the multiplexer. The control input of the multiplexer selects which data input of the multiplexer is connected to an external component. Each data input is individually connected to the component periodically.

System located in an integrated circuit for reducing calibration components

Saturated tabletop lasers having increased output energy and operating at 5 Hz repetition rate, were demonstrated at wavelengths about 18.9 nm for molybdenum targets, 16.4 nm for ruthenium targets, 14.7 nm for palladium targets, 13.9 nm for silver targets, and 13.2 nm for cadmium targets in transitions of nickel-like ions. The results were obtained using a sequence of two, plasma-generating pre-pulses, each having sub-Joule energy followed after a selected delay period by picosecond laser plasma excitation pulses having with an energy of about 1 J at angles of incidence optimized for maximum energy deposition.

Increased laser output energy and average power at wavelengths below 35 nm

A system and method for integrating a plurality of subcircuit grids in a simulation environment. Upon obtaining a subcircuit layer of a particular granularity for each logical component of an electrical entity (e.g., a semiconductor die in a package and board environment), the nodes of a first subcircuit layer are interconnected to the nodes of a second subcircuit layer using a constraint-based search process.

System and method for integrating subcircuit models in an integrated power grid analysis environment

Systems and methods associated with generating node level bypass capacitor models are disclosed. One embodiment of a system may comprise a plurality of bypass capacitor circuit models associated with respective bypass capacitors and a node level model generator. The node level model generator may associate bypass capacitor information for a plurality of bypass capacitors from a data base associated with a multi-layer structure design with respective bypass capacitor circuit models to provide a node level capacitor model for the plurality of bypass capacitors.

Systems and methods for generating node level bypass capacitor models

A method of analyzing a circuit comprising a plurality of interconnects is disclosed herein. The method may comprise analyzing at least one electrical property associated with a first interconnect, wherein the first interconnect has at least one first physical dimension. The electrical property may then be stored. A second interconnect having the at least one first physical dimension may then be located and the at least one electrical property is applied to the second interconnect.

Method and device for analyzing circuits

One disclosed embodiment may include a method that includes providing a first set S-parameters for a path of a first substrate having a first port and a second port and providing a second set of S-parameters for a path of a second substrate having a first port and a second port. Waveform parameters are measured for an aggregate path that includes the path of the first substrate, the path of the second substrate, and a structure interconnecting the first and second substrates to provide a third set of S-parameters. A fourth set of S-parameters is calculated for the structure interconnecting the first and second substrates based on the first, second, and third sets of S-parameters.

System and method for determining S-parameters of a connected structure

A system and method can be utilized to determine S-parameters of a network. In one embodiment a system includes an S-parameter calculator that computes the S-parameters of the network based on waveform parameters determined from single port measurements. At least one of the single port measurements corresponds to measurements at one of the plural ports while a matched load is applied to at least another of the plural ports.

Growing community of inventors

Fort Collins, CO, United States of America

Yong Wang