Samsung Electronics Co., Ltd.

Electronics and Telecommunications Research Institute

Dongguk University Industry-academic Cooperation Foundation

Yong June Kim

Jun Jin Kong

Jae Hong Kim

Kyoung Lae Cho

Jaehong Kim

Hong Rak Son

Junjin Kong

Heeseok Eun

Seung-Hwan Song

Ki Jun Lee

Jung Soo Chung

KyoungLae Cho

Kijun Lee

Dong Hyuk Chae

Seonghyeog Choi

Beom Kyu Shin

Jong Seon No

Seong Hyeog Choi

Jae Dong Yang

Seok Il Youn

Jong Han Kim

Hyun Kyu Chung

Byung Jang Jeong

Hongrak Son

Taegyun Noh

Yoon Sun Park

Han Woong Yoo

Sang Yong Yoon

Hee Seok Eun

Seung Hwan Song

Dae Woon Lim

Seong Hyeong Choi

Min Joong Lim

Yongtaew Yim

Wootae Chang

Ha Bong Chung

Keun Sung Choi

Ho Yun Kim

Provided are a memory system and an operating method thereof. The operating method reads an observation memory cell at least one time with different read voltages to configure a first read data symbol, reads a plurality of interference memory cells adjacent to the observation memory cell at least one time with different read voltages to configure second read data symbols, and determines a logical value of the observation memory cell based on the first read data symbol and the second read data symbols.

Memory system to determine interference of a memory cell by adjacent memory cells, and operating method thereof

An apparatus and a method for reading from a non-volatile memory whereby soft decision data is used to determine the reliability of hard decision data. The hard decision data read from the non-volatile memory is de-randomized and the soft decision data read from the non-volatile memory is not de-randomized. Using the soft decision data, the hard decision data is decoded.

Method of reliably reading data stored in multi-level cell (MLC) non-volatile memory

A data processing device which includes a conversion circuit and a pseudo random number generator including a series connection of plural shift registers. The conversion circuit receives a pseudo random number sequence from an output of one of the plural shift registers excluding a last shift register of the series connection, and converts first data to second data using the received pseudo random number sequence.

Device and method for processing data including generating a pseudo random number sequence

A method for operating a controller may include storing a pseudo noise (PN) sequence provided from a PN sequence generator in an i-th area of a seed table and cyclically shifting the PN sequence from the i-th area to an (i+1)-th area in the table to form the table. The table may include row and column areas. A method for operating a controller may include receiving a sequence from a sequence generator, splitting the sequence into seed units, storing split sequences in a j-th area of the seed table, and forming the table including the seed units corresponding to the split sequences stored in the j-th area. A method for operating a controller may include storing a sequence provided from a sequence generator in a seed table that includes a plurality of areas and cyclically shifting the sequence in the table until a seed is formed in each area.

Methods for operating controllers using seed tables

Memory devices and/or methods of managing memory data errors are provided. A memory device detects and corrects an error bit of data read from a plurality of memory cells, and identifies a memory cell storing the detected error bit. The memory device assigns a verification voltage to each of the plurality of first memory cells, the assigned verification voltage corresponding to the corrected bit for the identified memory cell, the assigned verification voltage corresponding to the read data for the remaining memory cells. The memory device readjusts the data stored in the plurality of memory cells using the assigned verification voltage. Through this, it is possible to increase a retention period of the data of the memory device.

Memory device and method of managing memory data error including determining verification voltages and changing threshold voltages based on a corrected error bit

Methods of operating nonvolatile memory devices include testing strings of nonvolatile memory cells in the memory device to identify at least one weak string therein having a higher probability of yielding erroneous read data error relative to other strings. An identity of the at least one weak string may be stored as weak column information, which may be used to facilitate error detection and correction operations. In particular, an error correction operation may be performed on bits of data read from the strings using an algorithm that modifies a weighting of the reliability of one or more data bits in the bits of data based on the weak column information. More specifically, an algorithm may be used that interprets a bit of data read from the at least one weak string as having a relatively reduced reliability relative to other ones of the data bits.

Methods of performing error detection/correction in nonvolatile memory devices

Provided is a data processing method in a semiconductor memory device. The data processing method arranges data, which is to be programmed in a row and column of a nonvolatile memory device, in a row or column direction. The data processing method encodes the programmed data into a modulation code in the row or column direction such that adjacent pairs of memory cells of the nonvolatile memory device are prevented from being programmed into first and second states.

Semiconductor memory device and data processing method thereof

Disclosed is a flash memory device which includes a memory cell array configured to store data, a randomizer configured to generate a random sequence, to interleave the random sequence using at least one of memory parameters associated with data to be programmed in the memory cell array, and a control logic circuit configured to provide the memory parameters to the randomizer and to control the randomizer.

Flash memory devices, data randomizing methods of the same, memory systems including the same

A data storage device includes a non-volatile memory device including a plurality of memory cells and a memory controller. The memory controller is configured to modify an arrangement of program data and to program the modified program data into the plurality of memory cells. The memory controller modifies the program data to eliminate a given data pattern causing physical interference between adjacent memory cells from the modified program data.

Data storage device and program method that modifies arrangement of program data to eliminate interfering data patterns

A non-volatile semiconductor memory device and related method of determining a read voltage are disclosed. The non-volatile semiconductor memory device includes; a memory cell array including a plurality of memory cells, a read voltage determination unit configured to determine an optimal read voltage by comparing reference data obtained during a program operation with comparative data obtained during a subsequent read operation and changing a current read voltage to a new read voltage based on a result of the comparison, and a read voltage generation unit configured to generate the new read voltage in response to a read voltage control signal provided by the read voltage determination unit.

Non-volatile memory device, memory card and system, and method determining read voltage by comparing referenced program data with comparative read data

A storage device includes a non-volatile memory device outputting read data from a source area and a memory controller configured to execute an ECC operation on a plurality of vectors in the read data and to write the error-corrected read data into target area of the non-volatile memory device. The memory controller declares that a vector corresponding to a clean area is decoding pass without using a flag bit among the plurality of vectors during the error correction operation.

Storage device having a non-volatile memory device and copy-back method thereof

Encoding/decoding memory devices and methods thereof may be provided. A memory device according to example embodiments may include a memory cell array and a processor including at least one of a decoder and an encoder. The processor may be configured to adjust a redundant information rate of each channel, where each of the channels is a path of the memory cell array from which data is at least one of stored and read. The redundant information rate may be adjusted by generating at least one codeword based on information from a previous codeword. Therefore, example embodiments may reduce an error rate when data is read from and written to the memory device.

Encoding and/or decoding memory devices and methods thereof

A memory device includes a memory cell array, a self interleaver configured to interleave and load data on the fly into a buffer circuit using an interleaving scheme, and a control logic configured to control programming of the interleaved data in the memory cell array.

Memory device and self interleaving method thereof

A method of programming multi-level cells included in a spare region, the method including programming first page data and at least one first dummy data in a first multi-level cell; and programming second page data and at least one second dummy data in a second multi-level cell.

Method for programming non-volatile memory device and apparatuses performing the method

A method of encoding multi-bit level data includes: determining a range of an error pattern generated according to a transmission symbol, encoding an M-bit level of a P-bit level corresponding to the transmission symbol based on the range of the error pattern, and excluding encoding of a P-M bit level of the P-bit level. The variable P is a natural number of a value at least two, and the variable M is a natural number less than P.

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Seoul, South Korea

Yong June Kim