Lg Philips Lcd Co., Inc.

Lg Display Co., Ltd.

Korea Food Research Institute

Lg.phillips Lcd Co., Ltd.

Yong Jin Cho

See Hwa Jeong

Jung Il Lee

Yong Kim

Jae Ho Kim

Jin Ho Kim

Hyun Kyu Lee

Jong Dam Kim

Sung Ki Kim

Sung Joon Bae

Min Joo Kim

Juhn Suk Yoo

Hae Yeol Kim

Chul Jin Kim

Hyo Sop Kim

Chong Tai Kim

Aei Jin Choi

A method for manufacturing a substrate of an analytical sensor and the substrate thus prepared are disclosed. The method for manufacturing the substrate of the sensor application according to the present invention is characterized in that it comprises (a) the step of preparing a dispersed solution of nanoparticles, which are stable in a volatile organic solvent due to surface modification of nanoparticles having a pre-designed certain size on the nanometer level with an organic functional group (b) the step of preparing a single layer film of nanoparticles surface-modified with the organic functional group on the interface using said dispersed solution of nanoparticles on the basis of the Langmuir-Blodgett method, and then transferring said single layer film of nanoparticles to the substrate; and (c) the step of coating the substrate to which said single layer film of nanoparticles is transferred, with the metal thin film by means of the vacuum vapor deposition, and then optionally removing nanoparticles to manufacture a nanostructure to be used as the analytical sensor using optical characteristics. According to the method for manufacturing the substrate of the sensor application according to the present invention as above, the nanoparticles can be uniformly fixed on the solid substrate having a great area above 10&#xd7;10 cmusing the Langmuir-Blodgett method, and by such method the size, distance and shape of nanoparticles can be controlled to manufacture the nanostructures to be used as the analytical sensor, which is possible to reproduce and mass-produce. When the sensitivity property of the sensor is measured using the nanostructure substrate, thus produced, to be used as the analytical sensor, it can be identified that the sensitivity can be highly improved.

Substrate manufacturing method for sensor applications using optical characteristics and the substrate therefrom

A method of manufacturing a thin film transistor array substrate to prevent damage to a pad is disclosed. The method includes forming gate lines and data lines that cross each other on a lower substrate, a gate insulating film located between the gate and data lines, a thin film transistor formed at every crossing, a lower gate pad electrode connected to the gate, and a lower data pad electrode; forming a passivation film on the substrate provided with the gate insulating film; forming a photo-resist pattern on the substrate provided with the passivation film; forming a first hole passing through a portion of the passivation film and a portion of the gate insulating film; removing the photo-resist pattern; forming a second hole exposing the lower gate pad electrode; and forming a transparent electrode pattern including an upper gate pad electrode connected to the exposed lower gate pad electrode.

Method of manufacturing thin film transistor array substrate

A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Method and apparatus for testing liquid crystal display device

A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

Method and apparatus for testing liquid crystal display using electrostatic devices

A method for fabricating a liquid crystal display includes providing a first substrate having a pixel part and a driving circuit part, forming a gate electrode in the pixel part of the first substrate, forming a first insulation film, a first amorphous silicon thin film and a second amorphous silicon thin film on the first substrate, forming a first conductive film on the first substrate, having the first insulation film, the first amorphous silicon thin film, and the second amorphous silicon thin film, selectively patterning the first conductive film, the second amorphous silicon thin film and the first amorphous silicon thin film to form an active pattern in each of the pixel part and the driving circuit part of the first substrate and source and drain electrodes, crystallizing the first amorphous silicon thin film constituting the active pattern of the driving circuit part, forming a second insulation film on the first substrate, forming a pixel electrode in the pixel part and a gate electrode in the driving circuit part, and attaching the first substrate to a second substrate.

Liquid crystal display device and fabrication method thereof

A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

Method and apparatus for inspecting flat panel display

Method and apparatus for testing liquid crystal display

A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.

A thin film transistor liquid crystal display is designed such that TFTs for driving green pixels are formed in the blue pixel regions. This improves the overall brightness of the liquid crystal display based on the human view-sensitive characteristics.

Liquid crystal display having green TFT in blue pixel region

A method and apparatus tests a flat display device to inspect for shorts and open circuits in a signal wire by using a magnetic sensor. The inspection method and apparatus scans the magnetic sensor along signal wires in a scan direction crossing multiple signal wires and detects at least one of a short or an open circuit in the signal wires based on current detected by the magnetic sensor.

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Seoul, South Korea

Yong Jin Cho