Gigalane Co., Ltd.

Other

Withwave

Defense Agency for Technology and Quality

Withwave Co., Ltd.

Yong Goo Lee

Kyoung Il Kang

Maeng Youl Lee

Jeong Il Jeon

Jang Mook Lee

Sung Jin Kim

Hee Seok Jung

Kyung Hun Jung

Jeong Nam Cheon

Kyu Han Lee

Dong-il Lim

Dong Il Lim

Soo Joo Lee

Seong Soo Han

Bum Hee Bae

Jong Wan Shim

Young Kun Kwon

Youn Ho Kim

Kwang Seok Choi

Nam Sik Lee

Chong Ho Chi

Duk Kyu Kwon

Hai Young Lee

Min Su Park

Proposed is a pin array assembly and a connector for high-speed signal transmission using the same and, more particularly, a connector technology in which high-speed signal transmission characteristics are guaranteed by implementing a pin array assembly with multiple pins whose pitches are precisely adjusted by insert injection and a connector capable of relieving stress caused by an external force while applying the pin array assembly.

Pin array assembly and connector for high-speed signal transmission using the same

Proposed is a multiple coaxial cable connector. The multiple coaxial cable connector includes: multiple coaxial cables, each of the coaxial cables having a cable connector with a pogo pin end making contact with a printed circuit board; a cable guide housing having multiple cable through-holes, each of the cable through-holes allowing a part of each of the coaxial cables including the cable connector to be inserted and guided therein; a cable locker fitted over the coaxial cables and thus coupling the cable guide housing and the coaxial cables to each other; a housing cover covering the lateral surface of the cable guide housing; a reference plate having multiple through-holes, each of the multiple through-holes allowing the cable connector of each of the multiple coaxial cables to be inserted thereinto; and a housing screw coupling the cable guide housing to a coupling hole formed in the printed circuit board.

Multiple coaxial cable connector

Disclosed is a calibration apparatus for a network analyzer, including a communication portion configured to communicate with the network analyzer to input or output data necessary for calibration, a signal input portion configured to receive a signal notifying a start of the calibration input, at least one radio frequency (RF) port for being connected to the network analyzer, at least one adaptor configured to connect the RF port with the network analyzer, an impedance circuit portion connected to the RF port and configured to include at least one standard impedance, and a controller portion configured to generate calibration data using adaptor characteristic data corresponding to electrical characteristic of the adaptor, measurement data obtained by connecting each of such standard impedances with the network analyzer, and standard impedance characteristic data corresponding to the standard impedance.

Calibration apparatus and method for network analyzer

Provided is a terminal including a high frequency (HF) communication line using a flexible printed circuit board (FPCB). The terminal includes a base board, a main board, an antenna, a battery, and an FPCB connected between the main board and the antenna and formed with an HF communication line for radio frequency (RF) communication. The FPCB includes a first connection formed on one end thereof and electrically connected to the main board, a second connection formed on another end thereof and electrically connected to the antenna, and a connector connecting the first connection with the second connection and bent at the right angle with the first connection and the second connection to vertically stand between the battery and the wall plate of the base board, thereby maximizing an area for the battery.

Terminal having HF transmission line using printed circuit board

Disclosed is a connector for preventing unlocking which includes a signal pin transferring a signal; a body into which the signal pin is inserted and which is electrically isolated from the signal pin; a first housing having a hollow portion into which one end of the body is inserted, a thread groove and at least one protruding portion or a plurality of fixing grooves formed at an inner circumferential surface of the other end thereof; and a second housing having a hollow portion into which the other body end is inserted and through which the second housing is moved along an outer circumferential surface of the body in an axial direction.

Connector for preventing unlocking

There is provided a probe card comprising a plurality of probe tips, each being ball-shaped or pillar-shaped and having a top end in contact with each of target chip pads to be tested; a first space converting unit; a second space converting unit; a frame configured to support the second space converting unit; an interposer unit; and a circuit board.

Probe card for testing a semiconductor chip

There is provided a probe block comprising a probe including first contact portions, second contact portions, and beams connecting the first contact portion to the second contact portion and a guide where the probe is inserted and supported, wherein the probe block is installed in a probe card for inspecting a semiconductor chip.

Probe block

A grounding unit for a high-frequency connector is provided, wherein the grounding unit may include a grounding unit body configured to be selectively fixed to the high-frequency connector; and a grounding fixation unit configured to be connected to the grounding unit body, to be in pressure contact with a grounding region of a printed circuit board (PCB) under elastic force applied in proportion to a thickness of the PCB, and to electrically connect the high-frequency connector to the grounding region.

Grounding unit for high-frequency connector and high-frequency connector module having the same

There is provided a micro connector mounted on a printed circuit board (PCB) comprising a core conductor including a contact terminal formed of two or more insertion panels and a signal transmission panel; a body including a trunk formed in the shape of a barrel surrounding the contact terminal, and one or more projection arms extended from a bottom of the trunk; a dielectric; and a tail including a bottom panel disposed opposite to the signal transmission panel, interposing the body therebetween, and supporting the dielectric.

Connector having a tail with vertical panels inserted into a dielectric holding a contact terminal surrounded by a body

A probe card of a semiconductor test apparatus having a plurality of space transformers supporting probe units of the probe card is provided. A probe card of the present invention includes a plurality of probe units, each comprising a guide member and at least one probe secured by the guide member and contacting a chip pad to be tested; a plurality of space transformers arranged below the respective probe units, each space transformer having wires electrically connected to lower terminals of the probes; a frame having a plurality of guide holes for fixedly positioning the respective probe units; an interposer array arranged below the space transformers for supporting the space transformers, interposer array comprising electrical connection means for supplying test signals to the wires of the space transformers; and a printed circuit board arranged below the interposer array for supporting the interposer array and electrically connected to the electrical connection means for supplying the test signals. In the probe card of the present invention, the probe units are independently supported by respective space transformers such that it is possible to reduce thermal distortion of the probe card and simplifying the manufacturing and repairing processes.

Probe card having a plurality of space transformers

A probe block mounted on a probe card is provided for achieving fine pitch probes. A probe block for a probe card of a semiconductor test device according to the present invention includes a guide member and a probe. A guide member includes pairs of upper and lower holes and middle holes each interconnecting the upper and lower holes of each pair. A probe includes a first pin tip protruded through a corresponding upper hole for contacting a pad of a device to be tested and a second pin tip protruded through a corresponding lower hole for transferring an electrical signal to the device and a bridge part situated within the middle hole for interconnecting the first and second pin tips. The upper, lower, and middle holes allow the probe to elastically moves in vertical direction. The probe block of the present invention is advantageous in that the probes are supported by guide members so as not to be bent while maintaining a fine pitch. Also, the probe block of the present invention is advantageous in fabrication and repair since probes are elastically contacted rather than directly bonded to the circuit substrate of the probe card.

There is provided a printed circuit board (PCB) comprising a first ground layer extended in one direction; a first dielectric layer laminated on the first ground layer and extended in the same direction of the first ground layer; a signal transmission line laminated on the first dielectric layer and extended in the same direction of the first dielectric layer; a first bonding sheet disposed above the first dielectric layer; a second bonding sheet disposed above the first dielectric layer; a second dielectric layer disposed above the signal transmission line, the first bonding sheet, and the second bonding sheet; and a second ground layer laminated on the second dielectric layer.

Printed circuit board removing bonding sheet around signal transmission line

The present disclosure provides a printed circuit board (PCB) comprising a first ground layer extended in one direction a first dielectric layer laminated on the first ground layer and extended in the same direction as that of the first ground layer; a signal transmission line laminated on the first dielectric layer and extended in the same direction as that of the first dielectric layer; and a plurality of first ground patterns formed by etching a surface of the first ground layer in an axial direction thereof at a predetermined interval in a line, wherein the plurality of first ground patterns expose the first dielectric layer.

Printed circuit board

The present invention is a magnetic chuck that is chiefly used for machining tools. The magnetic chuck has a structure in which an accommodation hole () is formed to pass through a chuck main body (), a first magnetic element () is exposed in the direction of the top surface of the chuck main body (), and an AlNiCo magnet () is exposed in the direction of the bottom surface of the chuck main body (), so that respective objects (and) to be attached can be attached to two opposite surfaces of the magnetic chuck (), with the result that the magnetic chuck () can be used in various ways. Furthermore, the lateral part () of the chuck main body () is not unnecessary, so that the weight of the magnetic chuck () itself is greatly reduced and thus the product cost is reduced, the thickness of the magnetic chuck () is reduced, and convenience of use can be greatly improved.

Magnetic chuck

A coaxial connecting device is provided for making an electrical connection between a coaxial cable and a device under test. A coaxial connecting device electrically connects a coaxial cable to a signal pad and a ground pad. The coaxial contractor of the present invention includes a signal pin for electrically connecting a signal conductor of the coaxial cable to the signal pad; a ground connector for electrically connecting a ground conductor of the coaxial cable to the ground pad; a cylindrical guide tube surrounding the ground conductor for elastically contacting the ground connector while maintaining a predetermined distance with the signal pin; and a dielectric member surrounding a part of the signal pin for electrically isolating the cylindrical guide tube and the signal pin from each other and coaxially maintaining the guide tube and the signal pin. The coaxial connecting device of the present invention minimizes a contact path between the ground conductor of a coaxial cable and a ground pad and provides impedance matched coaxial signal transmission link, resulting in improvement of frequency characteristics.

Growing community of inventors

Seoul, South Korea

Yong Goo Lee