Hitachi, Ltd.

Hitachi Global Storage Technologies Netherlands B.v.

Yoko Ogawa

Yuzuru Hosoe

Hiroshi Tani

Yoshiyuki Hirayama

Reiko Arai

Ikuko Takekuma

Tomio Iwasaki

Hiroyuki Suzuki

Hiroyuki Matsumoto

Koji Sonoda

Akira Kato

Yoshibumi Matsuda

Yotsuo Yahisa

Takayuki Nakakawaji

Koji Sakamoto

Takaaki Shirakura

Susumu Funamoto

Tomonori Kozaki

Mitsuhiro Shyoda

Masanori Inoue

Embodiments of the invention provide a medium which provides high media S/N and good corrosion resistance. According to one embodiment, in a perpendicular magnetic recording medium at least comprising a soft-magnetic underlayer, a seed layer, an intermediate layer, a magnetic recording layer and an overcoat layer which are stacked over a substrate in order, the magnetic recording layer has a granular structure which consists of many columnar grains of CoCrPt alloy and a grain boundary layer containing an oxide, the seed layer is made of TaNi alloy or TaTi alloy and the intermediate layer is made of Ru or Ru alloy which contains about 80 at. % Ru or more.

Perpendicular magnetic recording medium for high density recording and manufacturing of the same

Embodiments of the invention are directed to a medium which provides high media S/N and good corrosion resistance. According to one embodiment, in a perpendicular magnetic recording medium at least comprising a soft-magnetic underlayer, a seed layer, an intermediate layer, a magnetic recording layer and an overcoat layer which are stacked over a substrate in order, the magnetic recording layer has a granular structure which includes many columnar grains of CoCrPt alloy and a grain boundary layer containing an oxide, the seed layer is made of TaNi alloy or TaTi alloy and the intermediate layer is made of Ru or Ru alloy which contains 80 at. % Ru or more.

Perpendicular magnetic recording medium for high density magnetic recording and manufacturing of the same

To provide an atomic force microscopy which allows the measurement of the configuration of a surface being measured by using the phenomenon observed between the surface being measured and a probe approaching thereto at very fine distance. By selecting the material of the tip surface of said probe such that the surface energy of said probe tip becomes less than the interface energy between the tip surface and the surface being measured, thereby the surface configuration of soft body, or soft fouling adhered to the body surface can be measured. A method of measuring the surface configuration and a method of producing magnetic recording medium using the same are also provided.

Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium

Magnetic recording medium

A magnetic recording medium having a high reliability of durability against frictional motion can be ensured even in a severe rubbing test, while a low noise characteristic important for achievement of high-density recording is kept. A first underlayer made of an alloy containing Co or Ni as a main component and containing Cr and Zr simultaneously is formed over a base, a second underlayer having a rough surface is formed on the first underlayer, a third underlayer made of an alloy containing Ni as a main component and containing Cr and Zr simultaneously is formed over the second underlayer, a fourth underlayer as a film for controlling crystalline orientation is formed on the third underlayer, a magnetic layer made of an alloy containing cobalt a main component is formed over the fourth underlayer, and a protective film containing carbon as a main component is formed on the magnetic layer.

Magnetic recording medium, method for producing the same and magnetic recording apparatus using the same

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Odawara, Japan

Yoko Ogawa