Ricoh Company, Ltd.

Tokyo Medical and Dental University

Advanced Telecommunications Research Institute International

Yoichiro Takahashi

Toshihiro Ishii

Toshihide Sasaki

Masayuki Fujiwara

Takeaki Shimokawa

Masaaki Sato

Satoru Sugawara

Shigenori Kawabata

Kazuhiko Adachi

Taishi Watanabe

Okito Yamashita

Sunao Chubachi

A biometric information display device includes a display controller configured to display a morphological image indicative of a morphology of a subject, on a display, an input controller configured to receive a designation of a specified position on the morphological image, a pathway generating section configured to generate a pathway based on the specified position on the morphological image, and a current extracting section configured to extract current components at a plurality of positions along the pathway, based on current information reconstructed based on magnetic field measurement data generated by the subject. The display controller displays the current components extracted along the pathway on the display.

Biometric information display device, biometric information display method, and computer-readable recording medium, extracting current components at positions along a neural pathway based on current information reconstructed based on magnetic field measurement data generated by subject

An optical sensor includes a light emitter configured to irradiate a surface of an object with a plurality of non-parallel light beams, a light detector configured to detect a plurality of light beams that have been reflected within the object and have returned to the surface from a plurality of directions, a recording unit configured to store pre-calculated results of a plurality of models having different optical properties and physical structures, and a calculating unit configured to calculate a light amount ratio of the plurality of reflected light beams, and estimate an optical property of the object based on the calculated light amount ratio and the pre-calculated results.

Optical sensor

A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system.

Optical examination method and optical examination device

An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.

Optical sensor, optical examination device, and optical property detection method

An optical sensor is provided. The optical sensor has an emitting system including at least one light emitting device which emits light onto an object; and a detecting system detecting the light which has been emitted by the emitting system and which has propagated through the object. The light emitting device is capable of emitting a plurality of light beams with different wavelengths onto substantially the same position of the object.

Optical sensor, optical testing apparatus, and optical characteristics detection method

An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.

Optical sensor, optical inspection device, and optical property detection method for detecting light propagated inside a test object

An optical sensor includes an irradiation system including at least one light irradiator to irradiate light onto an object under test; and a detection system detecting the light that is irradiated from the irradiation system and is propagated in the object under test. Further, the light irradiator irradiates non-parallel plural light beams on a same position of the object under test.

Growing community of inventors

Miyagi, Japan

Yoichiro Takahashi