Panasonic Corporation

Yoichi Shintani

Yasutaka Tsutsui

Tatsuhiro Tomiyama

Tomoyuki Maeda

Mitsuhiro Murata

Tasuku Ishibashi

Ryuichi Murai

Hiroshi Sakurai

Toshiyuki Akiyama

Yo Hibino

Toshiaki Onimaru

Masaki Yoshinari

Yoichi Okumura

An organic electroluminescence (EL) device whose organic EL layer is less likely exposed to moisture. The organic EL device includes an organic EL layer; and a hygroscopic layer disposed with respect to at least one main surface of the organic EL layer. The hygroscopic layer includes: a hygroscopic film containing a base material and a hygroscopic agent mixed in the base material; and a pair of covering films each covering a different one of surfaces of the hygroscopic film in a thickness direction of the hygroscopic film. A region of the hygroscopic film that is in contact with one covering film whose distance from the organic EL layer is smaller than a distance of the other covering film from the organic EL layer contains the hygroscopic agent at a content rate lower than an average content rate of the hygroscopic agent in the hygroscopic film.

Organic EL device

An organic EL device includes: an organic EL layer; and a hygroscopic layer that is disposed above and/or below the organic EL layer, and has a hygroscopic film, a first covering film, and a second covering film, the first covering film covering one of main surfaces of the hygroscopic film, the second covering film covering the other main surface of the hygroscopic film, wherein a relational expression A/B&#x2267;0.2 is satisfied, where A denotes hygroscopicity indicating mass of moisture, expressed in g/m, that is absorbable by the hygroscopic film per unit of area, and B denotes the number of defects per unit of area, expressed in pieces/mm, that is calculated based on the number of defects in each of the first covering film and the second covering film.

Organic EL device having a hygroscopic layer

The radiation detector includes: a housing defining an enclosed space filled with a radiation detection gas; first and second electrodes opposing each other across the enclosed space; insulating materials covering surfaces of the first and second electrodes facing the enclosed space; and a voltage source for applying a voltage to the first and second electrodes, whereby a radiation sensor is formed. The radiation sensor is configured so that: in a radiation detection period, a predetermined voltage is applied between the first and second electrodes, and an electric charge is accumulated on the insulating materials by ions and/or electrons generated by ionization of the gas by incident radiation; and in a radiation measurement time, an electric discharge is caused by applying a reverse bias voltage from that applied to the first and second electrodes in the radiation detection period, and a firing voltage is measured.

Radiation detector

A forming method of a protective film made of oxide containing any one of calcium oxide (CaO), strontium oxide (SrO) and barium oxide (BaO) and having a higher band gap than that of magnesium oxide (MgO) (higher than 7.9 eV) is provided. By adjusting a time constant of a protective film to a predetermined value or larger, the voltage drop time is adjusted so as to be usable for a plasma display panel. At this time, the time constant &#x3c4;(=C&#xd7;R) defined by the discharge capacitance C and the protective film resistance R is referenced.

Plasma display panel and protective film protecting electrodes of plasma display panel

In a PDP having row electrode pairs and column electrodes formed on the front glass substrate placed parallel to the back glass substrate with a discharge in between, each of the column electrodes faces a central area between adjacent transparent electrodes of the row electrode in the row direction, and is placed in a position closer to the transparent electrode serving as its partner for initiating an address discharge than to the unrelated transparent electrode located on the opposite side of the column electrode.

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Osaka, Japan

Yoichi Shintani