Canon Kabushiki Kaisha

Subaru Corporation

Nec Corporation

Sumitomo Osaka Cement Co., Ltd.

Mitsubishi Heavy Industries Limited

Hitachi High-tech Science Corporation

Toyota Jidosha Kabushiki Kaisha

The University of Tokyo

Ihi Corporation

Xebec Technology Co., Ltd.

Taimei Chemicals Co., Ltd.

Microsoft Technology Licensing, LLC

Pioneer Electronic Corporation

Tokyo Institute of Technology

Yoichi Sato

Takahiro Suzuki

Marosuke Kikuchi

Yasuyuki Kurino

Kenji Harada

Takeshi Otsuka

Jun Horigome

Kazuo Ichinokawa

Takeru Yamaguchi

Shoichiro Sako

Yuki Tanaka

Tatsuyuki Tokunaga

Ryota Sakisaka

Yoshihiro Suda

Daisuke Yamaguchi

Atsushi Yonemura

Yutaka Yamagishi

Takao Takano

Toshimasa Kobayashi

Rino Nakajima

Haruka Miyanishi

Kazuma Ashizawa

Taiki Kanzawa

Akira Inoue

Koichi Nakamura

Kei Suzuki

Yoshihiro Oe

Ryosuke Nakamura

Hironobu Sugimoto

Motoki Hirano

Shojiro Takeuchi

Hiroaki Sekiyama

Shintaro Kumano

Shin Asano

Toru Kinoshita

Daisuke Hirabayashi

Toshimichi Ogisu

Kenichi Horiguchi

Kotaro Tadano

Johji Tajima

Takashi Matsuzawa

Toshiyuki Namba

Keisuke Okamoto

Suguru Matsushita

Yasunori Hiroshima

Satomi Yoshioka

Yasunori Shibao

Naoki Takamiya

Yoshizumi Ishikawa

Manabu Akagi

Yasutaka Fuke

Shiro Kumano

Masayuki Akiyama

Yoshitaka Yamamoto

Hirone Komatsu

Koshiro Irie

Toru Onishi

Peirong Liu

Takanori Karato

Masato Kurita

Yusuke Hosen

Junya Tokuda

Tadashi Ohtsuka

Tadashi Otsuka

Ryosuke Inomata

Yuki Matsuda

Takayuki Hirasawa

Shuguang Li

Hironori Takahashi

Koichi Morimura

Shinichiro Hori

Tsuyoshi Kawase

Yuko Katsube

Keisuke Fukushima

Michinari Kozuma

Taku Ezaki

A method of producing a structure by coupling a first component to a second component and inserting a shim into a gap formed between the first component and the second component includes: measuring first and second profiles of first and second surfaces of the first and second components before completing positioning of the first and second components to coupling positions; measuring third and fourth profiles of third and fourth surfaces of the first and second components before completing the positioning; performing the positioning by butting the first surface against the second surface; measuring fifth and sixth profiles of the third and fourth surfaces after completing the positioning; calculating a size of the gap based on the first to sixth profiles; producing the shim based on the size of the gap; and coupling the second component to the first component with the shim inserted and the positioning completed.

Method of producing structure

An inspection cable guide mechanism of the present disclosure includes a heat-resistant sheath having flexibility through which a cable is allowed to be inserted and cooling air is allowed to flow toward a tip through a gap between the cable and the heat-resistant sheath, a segment stacked body configured by stacking segments having heat resistance configured to cover the heat-resistant sheath in a centerline direction, and a plurality of wires disposed around the heat-resistant sheath and extending along a centerline, one segment of the segment stacked body is swingable with respect to two segments adjacent to the one segment about swing axes extending in a direction perpendicular to the centerline, the two swing axes becoming centers when the one segment swings with respect to the two segments are perpendicular to each other when viewed in the centerline direction, and one end of each wire is fixed to one of the segments in the segment stacked body.

Inspection cable guide mechanism, driving device, inspection cable insertion jig, and gas turbine inspection system including these

A method of producing a structure including a first component, having a first surface, and a second component, having second and third surfaces includes: measuring profiles of the second and third surfaces; measuring profiles of fourth and fifth surfaces of subcomponents; assembling the first component by coupling the subcomponents with adjustment; recording data representing the adjustment; estimating a changed profile of the second surface in case of coupling the third surface to the first surface; determining a coupling position of the third surface to the first surface; and coupling the third surface to the first surface at the determined coupling position. The predetermined contour degree is required for the second surface. The first surface is formed by the fourth surfaces. The fifth surfaces influence a profile of the first surface. The changed profile is estimated based on the profiles of the second to fifth surfaces and the recorded data.

A centrifugal compressor includes: a housing including an intake flow path; a compressor impeller arranged in the intake flow path and including a plurality of blades; an accommodation chamber formed upstream of the blades in a flow of intake air in the housing; a movable member arranged in the accommodation chamber and movable to a protruding position where the movable member protrudes into the intake flow path and to a retracted position where the movable member is retracted from the intake flow path; and one or more grooves formed over an inner circumferential surface and a side face closer to the blades in the movable member.

Centrifugal compressor and turbocharger

A centrifugal compressor includes: a housing including an intake flow path; a compressor impeller arranged in the intake flow path and including a plurality of blades; an accommodation chamber formed upstream of the blades in a flow of intake air in the housing; a movable member arranged in the accommodation chamber and movable to a protruding position where the movable member protrudes into the intake flow path and to a retracted position where the movable member is retracted from the intake flow path; a plurality of slits formed closer to the blades with respect to the accommodation chamber in the housing and connected to the intake flow path; a plurality of compartment walls circumferentially separating the plurality of slits; and an outer circumferential wall connecting radially outer ends of the plurality of compartment walls.

A manufacturing assistance apparatus includes a learning unit and an estimator. The learning unit is configured to load a plurality of pieces of actual measurement data in each of which a gap and a plurality of parameters are associated with each other, and construct an estimation model on the basis of machine learning in which the plurality of pieces of actual measurement data serve as teacher data. The gap is provided between a first workpiece and a second workpiece that eventually structure an airframe of an aircraft and that are eventually fastened to each other. The estimation model estimates the gap from the plurality of parameters. The estimator is configured to derive an estimation value of a length of the gap on which measurement has not yet been performed, on the basis of the estimation model constructed by the learning unit and the plurality of parameters.

Manufacturing assistance apparatus

An inspection support system for erroneous attachment includes an imaging device and an erroneous attachment detector. The imaging device is configured to capture an image that represents a state in which multiple components are attached to each other. The erroneous attachment detector is configured to convert a color space of the image into an HSV color space, create a comparative image on the basis of hue and saturation in the HSV color space, determine whether the multiple components are each a correct component and whether the multiple components are attached in a correct manner by comparing the comparative image with a correct image that is based on the hue and the saturation, and detect the erroneous attachment of at least one of the multiple components, in a case where the at least one of the multiple components is not the correct component and/or is not attached in the correct manner.

Inspection support system for erroneous attachment using image color conversion

An assembling device includes a holding member and a processing device. The holding member is configured to hold a first assembly component and a second assembly component. The processing device is configured to process a first excess thickness portion and a second excess thickness portion. The first excess thickness portion is provided at the first assembly component and is configured to adjust a gap between the first assembly component and the second assembly component. The second excess thickness portion is provided at the second assembly component and is configured to adjust the gap.

Assembling device

A determination device includes a computer. The computer is configured to compare an image of a component that is captured and a correct image that is associated with an operation procedure manual and in which the component is captured. The computer is configured to determine whether a component shape in the image of the component and a component shape in the correct image agree. If the two component shapes do not agree, the computer is configured to determine that the component and the operation procedure manual do not match.

Determination device and determination system

A polishing device () includes a polishing brush () and a polishing brush holder () that holds the polishing brush (). The polishing brush holder () includes a shank (), a support mechanism () that has a sleeve () and supports the polishing brush () so as to be movable in an axial direction L of the shank (), and a moving mechanism () that moves the polishing brush () in the axial direction L. The polishing brush holder () includes a pressure sensor () that detects a load (sensor detection pressure (P)) applied from a workpiece (W) to the polishing brush () when the workpiece (W) is polished by the polishing brush () supported by the support mechanism (), and a control unit () that drives the moving mechanism () on the basis of the output (sensor detection pressure (P)) from the pressure sensor () to move the polishing brush () in the axial direction L.

Polishing tool holder and polishing device

An assembly apparatus includes a retainer, a position measurement device, and a machining device. The retainer is configured to hold an assembly. The position measurement device is configured to measure a difference between an intended machining position and an actual machining position of a first coupling hole in a first assembly component. The first coupling hole is capable of being coupled to the assembly. The machining device is configured to form a second coupling hole capable of communicating with the first coupling hole in the assembly based on a reference position set on the assembly and the difference.

Assembly apparatus

An object checking device includes an area specifying unit, an image generator, and a difference specifying unit. The area specifying unit is configured to, based on a feature part extracted from captured image data obtained by capturing an object, specify an area corresponding to the captured image data in 3D model data of the object. The image generator is configured to generate image data of the specified area from the 3D model data. The difference specifying unit is configured to specify a part in which there is a difference between the captured image data and the image data.

Object checking device

A component machining apparatus includes a measurement result acquiring unit and a machining data generator. The measurement result acquiring unit is configured to acquire a measurement result obtained by a measurer configured to measure a three-dimensional shape of a manufactured component among components of a structure. The manufactured component is manufactured earlier than a component of interest. The machining data generator is configured to generate machining data of the component of interest based on the measurement result of the manufactured component that has been acquired by the measurement result acquiring unit.

Component machining apparatus

To acquire both excellent spectrum and sample image reflecting actual conditions of a sample, and to increase convenience of measurement, provided is a display device for a photometric analyzer, which is configured to irradiate a sample with light to analyze the sample, the display device being configured to display a measurement result of the photometric analyzer, and including: a controller; and a display, which is configured to display an image based on measurement data processed by the controller. The measurement data at least contains a spectrum indicating an intensity of emitted light, which is emitted by the sample irradiated with the light, and a sample image of the sample, which is taken by an imaging device. The display is configured to display the spectrum and the sample image in an arrangement in the same screen.

Display device for photometric analyzer

In a standard process for determining an unknown sample, fluorescent substances are determined from respective fluorescence characteristics and model coefficients are calculated from spectrum ranges of the fluorescence characteristics of the determined fluorescent substances. An unknown sample is measured after reading of the model coefficients, whereby a target value of the unknown sample is obtained.

Unknown sample determining method, unknown sample determining instrument, and unknown sample determining program

Growing community of inventors

Tokyo, Japan

Yoichi Sato